Comparative Analysis on Positive Bias Stress-Induced Instability under High VGS/Low VDS and Low VGS/High VDS in Amorphous InGaZnO Thin-Film Transistors |
Kang, Hara
(School of Electronic Engineering, Kookmin University)
Jang, Jun Tae (School of Electronic Engineering, Kookmin University) Kim, Jonghwa (School of Electronic Engineering, Kookmin University) Choi, Sung-Jin (School of Electronic Engineering, Kookmin University) Kim, Dong Myong (School of Electronic Engineering, Kookmin University) Kim, Dae Hwan (School of Electronic Engineering, Kookmin University) |
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