Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors |
Choi, Sungju
(School of Electrical Engineering, Kookmin University)
Kang, Youngjin (School of Electronic and Electrical Engineering, Hongik University) Kim, Jonghwa (School of Electrical Engineering, Kookmin University) Kim, Jungmok (School of Electrical Engineering, Kookmin University) Choi, Sung-Jin (School of Electrical Engineering, Kookmin University) Kim, Dong Myong (School of Electrical Engineering, Kookmin University) Cha, Ho-Young (School of Electronic and Electrical Engineering, Hongik University) Kim, Hyungtak (School of Electronic and Electrical Engineering, Hongik University) Kim, Dae Hwan (School of Electrical Engineering, Kookmin University) |
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