Effects of Electrostatic Discharge Stress on Current-Voltage and Reverse Recovery Time of Fast Power Diode |
Bouangeune, Daoheung
(School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University)
Choi, Sang-Sik (R&D Division, Sigetronics, Inc.) Cho, Deok-Ho (R&D Division, Sigetronics, Inc.) Shim, Kyu-Hwan (School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University) Chang, Sung-Yong (Power Integrity Group, Korea Electric Power Research Institute (KEPRI)) Leem, See-Jong (Department of Hydrogen Energy, Dongshin University) Choi, Chel-Jong (School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University) |
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