Co-existence of Random Telegraph Noise and Single-Hole-Tunneling State in Gate-All-Around PMOS Silicon Nanowire Field-Effect-Transistors |
Hong, Byoung-Hak
(Dep. EE., Korea University)
Lee, Seong-Joo (Dep. EE., Korea University) Hwang, Sung-Woo (Dep. EE., Korea University) Cho, Keun-Hwi (Dep. EE., Korea University) Yeo, Kyoung-Hwan (Dep. EE., Korea University) Kim, Dong-Won (Dep. EE., Korea University) Jin, Gyo-Young (Dep. EE., Korea University) Park, Dong-Gun (Dep. EE., Korea University) |
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