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http://dx.doi.org/10.5573/JSTS.2010.10.4.316

Design of an EEPROM for a MCU with the Wide Voltage Range  

Kim, Du-Hwi (Dep. EE., Changwon National University)
Jang, Ji-Hye (Dep. EE., Changwon National University)
Jin, Liyan (Dep. EE., Changwon National University)
Ha, Pan-Bong (Dep. EE., Changwon National University)
Kim, Young-Hee (Dep. EE., Changwon National University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.10, no.4, 2010 , pp. 316-324 More about this Journal
Abstract
In this paper, we design a 256 kbits EEPROM for a MCU (Microcontroller unit) with the wide voltage range of 1.8 V to 5.5 V. The memory space of the EEPROM is separated into a program and data region. An option memory region is added for storing user IDs, serial numbers and so forth. By making HPWs (High-voltage P-wells) of EEPROM cell arrays with the same bias voltages in accordance with the operation modes shared in a double word unit, we can reduce the HPW-to-HPW space by a half and hence the area of the EEPROM cell arrays by 9.1 percent. Also, we propose a page buffer circuit reducing a test time, and a write-verify-read mode securing a reliability of the EEPROM. Furthermore, we propose a DC-DC converter that can be applied to a MCU with the wide voltage range. Finally, we come up with a method of obtaining the oscillation period of a charge pump. The layout size of the designed 256 kbits EEPROM IP with MagnaChip's 0.18 ${\mu}m$ EEPROM process is $1581.55{\mu}m{\times}792.00{\mu}m$.
Keywords
Wide voltage range; MCU; DC-DC converter; reliability;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
Times Cited By SCOPUS : 0
연도 인용수 순위
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