Extraction of Ballistic Parameters in 65 nm MOSFETs |
Kim, Jun-Soo
(Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University)
Lee, Jae-Hong (Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University) Kwon, Yong-Min (Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University) Park, Byung-Gook (Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University) Lee, Jong-Duk (Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University) Shin, Hyung-Cheol (Nano Systems Institute (NSI), Inter-University Semiconductor research Center (ISRC), and School of Electrical Engineering, Seoul National University) |
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