Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 nm MOSFETs |
Kim, Jun-Soo
(Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University)
Lee, Jae-Hong (Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) Yun, Yeo-Nam (Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) Park, Byung-Gook (Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) Lee, Jong-Duk (Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) Shin, Hyung-Cheol (Nano Systems Institute (NSI), Inter-University Semiconductor Research Center (ISRC), and School of Electrical Engineering, Seoul National University) |
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