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High Speed Pulse-based Flip-Flop with Pseudo MUX-type Scan for Standard Cell Library  

Kim, Min-Su (Sungkyunkwan University, Samsung Electronics)
Han, Sang-Shin (Samsung Electronics)
Chae, Kyoung-Kuk (Samsung Electronics)
Kim, Chung-Hee (Samsung Electronics)
Jung, Gun-Ok (Samsung Electronics)
Kim, Kwang-Il (Samsung Electronics)
Park, Jin-Young (Samsung Electronics)
Shin, Young-Min (Samsung Electronics)
Park, Sung-Bae (Samsung Electronics)
Jun, Young-Hyun (Samsung Electronics)
Kong, Bai-Sun (Sungkyunkwan University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.6, no.2, 2006 , pp. 74-78 More about this Journal
Abstract
This paper presents a high-speed pulse-based flip-flop with pseudo MUX-type scan compatible with the conventional master-slave flip-flop with MUX-type scan. The proposed flip-flop was implemented as the standard cell library using Samsung 130nm HS technology. The data-to-output delay and power-delay-product of the proposed flip-flop are reduced by up to 59% and 49%, respectively. By using this flop-flop, ARM11 softcore has achieved the maximum 1GHz operating speed.
Keywords
Flip flop; pulse; scan; standard cell; ARM11;
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