1/f Noise Characteristics of Sub-100 nm MOS Transistors |
Lee, Jeong-Hyun
(School of Electrical Engineering and Computer Science, Kyungpook National University)
Kim, Sang-Yun (School of Electrical Engineering and Computer Science, Kyungpook National University) Cho, Il-Hyun (R&D center, Magnachip Semiconductor Ltd.) Hwang, Sung-Bo (R&D center, Magnachip Semiconductor Ltd.) Lee, Jong-Ho (School of Electrical Engineering and Computer Science, Kyungpook National University) |
1 | M. J. Kirton, M. J. Uren, 'Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/f) noise,' Advances in Physics, vol. 38, pp. 367-468, 1989 DOI ScienceOn |
2 | J. Kolhatkar, E. Hoekstra, A. Hof, C. Salm, J. Schmitz, H. Wallinga, 'Impact of Hot-Carrier Degradation on the Low-Frequency Noise in MOSFETs Under Steady-State and Periodic Large-Signal Excitation,' IEEE Electron Device Latters, vol. 26, no. 10, pp. 764-766, 2005 DOI ScienceOn |
3 | M. Stegherr, 'Flicker noise in hot electron degraded short channel MOSFETs,' Solid State Elec., vol. 27, pp. 1055-1056, 1984 DOI ScienceOn |
4 | V. Dessard, J. P. Eggermont, D. Flandre, 'Thin-Film SOI n-MOSFET Low-Frequency Noise Measurements at Elevated Temperatures,' IEEE High-Temperature Electronic Materials, Devices and Sensors Conference, pp. 94-99, 1998 DOI |
5 | M. H. Tsai, T. P. Ma, 'The Impact of Device Scaling on the Current Fluctuations in MOSFET's,' IEEE Transactions on Electron Devices, vol. 41, no. 11, pp. 2061-2068, 1994 DOI ScienceOn |
6 | T. H. Lee, 'The Design of CMOS Radio-Frequency Integrated Circuits,' Cambridge, U.K.: Cambridge Univ. Press, 1998 |
7 | J. Chang, A. A. Abidi, C. R. Viswanathan, 'Flicker Noise in CMOS Transistors from Subthreshold to Strong Inversion at Various Temperatures,' IEEE Transactions on Electron Devices, vol. 41, no. 11, pp. 1965-1971, 1994 DOI ScienceOn |
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