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| 1 |
A Study of Electrical Anisotropy of n-type a-plane GaN films grown on  -plane Sapphire Substrates
Kim, Jae-Bum;Kim, Dong-Ho;Hwang, Sung-Min;Kim, Tae-Geun;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.1-6,
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| 2 |
Performances of  based n-type Organic Thin Film Transistor with A Doped Interlayer Using Bathophenanthroline
Kim, Jeong-Su;Son, Hee-Geon;Yi, Moon-Suk;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.7-12,
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| 3 |
Design of Optical Receiver Using Independent-Gate-Mode Double-Gate MOSFETs
Kim, Yu-Jin;Jeong, Na-Rae;Park, Sung-Min;Shin, Hyung-Soon;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.13-22,
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| 4 |
Dependence of Analog and Digital Performance on Carrier Direction in Strained-Si PMOSFET
Han, In-Shik;Bok, Jung-Deuk;Kwon, Hyuk-Min;Park, Sang-Uk;Jung, Yi-Jung;Shin, Hong-Sik;Yang, Seung-Dong;Lee, Ga-Won;Lee, Hi-Deok;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.23-28,
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| 5 |
An Efficient Test Pattern Generator for Low Power BIST
Kim, Ki-Cheol;Kang, Sung-Ho;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.29-35,
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| 6 |
Design of ESD Protection Circuits for High-Frequency Integrated Circuits
Kim, Seok;Kwon, Kee-Won;Chun, Jung-Hoon;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.36-46,
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| 7 |
Design of Timing Register Structure for Area Optimization of High Resolution and Low Power SAR ADC
Min, Kyung-Jik;Kim, Ju-Sung;Cho, Hoo-Hyun;Pu, Young-Gun;Hur, Jung;Lee, Kang-Yoon;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.47-55,
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| 8 |
A 12b 100MS/s 1V 24mW 0.13um CMOS ADC for Low-Power Mobile Applications
Park, Seung-Jae;Koo, Byeong-Woo;Lee, Seung-Hoon;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.56-63,
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| 9 |
A 1 GHz Tuning range VCO with a Sigma-Delta Modulator for UWB Frequency Synthesizer
Nam, Chul;Park, An-Su;Park, Joon-Sung;Pu, Young-Gun;Hur, Jeong;Lee, Kang-Yoon;
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The Institute of Electronics and Information Engineers
, v.47, no.8, pp.64-72,
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