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An Implementation of Efficient Functional Verification Environment for Microprocessor  

권오현 (삼성전자 DM연구소)
이문기 (연세대학교 전기전자공학과)
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Abstract
This paper proposes an efficient functional verification environment of microprocessor. This verification environment consists of test vector generator part, simulator part, and comparator part. To enhance efficiency of verification, it use a bias random test vector generator. In a part of simulation, retargetable instruction level simulator is used for reference model. This verification environment is excellent to find error which is not detected by general test vector and will become a good guide to find new error type
Keywords
마이크로프로세서;기능 검증;랜덤 테스트 벡터 생성기;명령어 수준 시뮬레이터;
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Times Cited By KSCI : 1  (Citation Analysis)
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1 권오현, 양훈모, 이문기, '마이크로프로세서 기능 검증을 위한 바이어스 랜덤 벡터 생성기 설계,' 대한전자공학회 하계종합학술대회 Vol.25, No.1, pp.121-124, June 2002   과학기술학회마을
2 C. Pixley, N. Strader, W. Bruce, J. Park, M. Kaufmann, K. Shultz, M. Burns, J. Kumar, J. Yuan, and J. Nguyen, 'Commercial Design Verification : Methodology and Tools,' Proc. IEEE Int. Test Conf., pp.839-848, 1996   DOI
3 P.J. Windley, 'Formal modeling and verification of microprocessors,' IEEE Transactions on Computers, Vol. 44, No. 1, pp.54-72, Jan. 1995   DOI   ScienceOn
4 M. Kantrowitz and L.M. Noack, 'I'm Done Simulating : Now What? Verification Coverage Analysis and Correctness Checking of the DEC chip 21164 Alpha Microprocessor,' Proc. Design Automation Conf.,pp.325-330, 1996
5 기안도, '단일 칩 시스템 설계검증을 위한 가상프로토타이핑,' 대한전자공학회 전자공학회지, 제30권, 제9호, pp. 59-69, Sep. 2003
6 Ta-Chung Chang, 'A Biased Random Instruction Generation Environment for Architectural Verification of Pipelined Processor,' in Journal of Electronic Testing : Theory and Applications 16, pp.13-27, 2000   DOI   ScienceOn
7 M.S. Abadir, J. Ferguson, and T.E. Kirkland, 'Logic Design Verification via Test Generation,' IEEE Trans. Computer-Aided Design, Vol.7, No.1, pp.138-148, Jan. 1988   DOI   ScienceOn
8 J. Freeman, R. Duerden, C. Taylor, and M. Miller, 'The 68060 Microprocessor Function Design and Verification Methodology,' Proc. On-Chip Systems Design Conf., pp.10.1-10.14, 1995
9 H. Iwashita, T. Nakata, and F. Hirose, 'Integrated Design and Test Assistance for Pipeline Controllers,'IEICE Trans. Information and Systems, Vol.E76-D, No.7, pp.747-754, 1993
10 D. Moundanos, J.A. Abraham, and Y.V. Hoskote, 'Abstraction Techniques for Validation Coverage Analysis and Test Generation,' IEEE Trans. Computers, Vol.47, No.1, pp.2-13, Jan. 1998   DOI   ScienceOn