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Experimental Extraction of Effective Permittivity on the Structures of Coplanar Waveguides  

지용 (서강대학교 공과대학 전자공학과)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.11, 2004 , pp. 15-20 More about this Journal
Abstract
This paper proposed a very simple method of extracting an effective permittivity from the data of scattering parameters measured on the transmission line of coplanar waveguides in the frequency range of microwave or millimeter waves. This is an extracting method of an effective permittivity $\varepsilon$$_{eff}$ in the case of $\beta$$\ell$ =n$\pi$ (n=integer), where the value of S$_{11}$ changes abruptly following the operating frequency. The experimental value of the effective permittivity $\varepsilon$$_{eff}$ on a dielectric substrate of Rogers 4003$^{TM}$ material of $\varepsilon$$_{r}$ =3.38 showed the value of 2.042, which differs in the error of -3.4% to 8% from those calculated from the previously reported formulae. This result showed that the measurement method was very simple, as well as applied directly to the fabricated circuit patterns, even though the circuit patterns might be complicated or on the substrate of different dielectric materials.s.als.
Keywords
effective permittivity; coplanar waveguide; scattering parameter;
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