Browse > Article

An Implementation of Automatic Boundary Scan Circuit Generator Supporting Private Instructions  

박재흥 (숭실대학교 컴퓨터학과)
장훈 (숭실대학교 컴퓨터학과)
Publication Information
Abstract
GenJTAG implemented in this paper is an automatic web-based boundary scan circuit generator. GenJTAG supports all the public instructions for the boundary scan technique, and also private instructions for other DFT techniques to be applied. Users can easily edit the generated boundary scan circuit code because it is described in behavioral level with the Verilog-HDL. GenJTAG has another advantage that any one can generate the boundary scan circuit by simply accessing to the web site.
Keywords
IEEE 1149.1; JTAG Generator; DFT; Boundary Scan; BIST;
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. H. Park, H. Chang and O. Y. Song, 'An Efficient Implement of BIST for Floating Point DSP Processor,' In Proc. Asia Pacific Conf. on ASICs, pp. 273-272, 2000   DOI
2 D. Belete, A. Razdan. W. Schwarz, R. Raina, C. Hawkins and J. Morehead, 'Use of DFT Techniques In Speed Grading a 1GH+ Microprocessor,' In Proc. Int'l Test Conf., pp. 1111 -1119, 2002   DOI
3 I. Parulkar, T. Ziaja, R. Pendurkar, A. D'Souza and A. Majumdar, 'A Scalable, Low Cost Design-for-Test Architecture for UItraSPARCTM Chip Multi-Processors,' In Proc. Int'l Test Conf. pp. 726-735, 2002   DOI
4 IEEE Standard 1149.1-1990, 'IEEE Standards Test Access Port and boundary-scan Architecture,' IEEE Standards Board, New York, 1990
5 K. P. Parker, The Boundary-Scan Handbook, Kluwer Academic Publishers, Norwell MA, 1992
6 M. Abramovici, M. A. Breuer and A. D. Friedman, Digital System Testing and Testable Design, Computer Science Press, 1990
7 M. Mayberry, J. Johnson, N. Shahriari and M. Tripp, 'Realizing the Benefits of Structural Test for Intel Microprocessors,' In Proc. Int'l Test Conf, pp. 456-463, 2002   DOI
8 B. Bailey, A. Metayer, B. Svrcek, N. Tendolkar, E. Wolf, E. Fiene, M. Alexander, R. Woltenberg and R. Raina, 'Test Methodology for Motorola's High Performance e500 Core Based on PowerPC Instruction Set Architecture,' In Proc. Ini'l Test Conf.., pp. 574-583, 2002   DOI
9 http://www.model.com
10 Brglez, F., Fujiwara, H., 'A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran,' IEEE int. Symp. on Circuits and Systems(ISCAS), PP. 677-692, 1985
11 Test Technology Standards Committee, 'IEEE Standard Test Access Port and Boundary-Scan Architecture,' IEEE Computer Society Press, 1993
12 박선호, PCI 버스 해설과 인터페이스 카드 설계, 국제테크노정보연구소, 1999
13 F. Karimi and F. Lombardi, 'A Scan-Bist Environment for Testing Embedded Memories,' In Proc. Int'l Workshop on Memory Technology, Design and Testing, pp. 17-23, 2002   DOI