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Operation of NMOSFET-only Scan Driver IC for AC PDP  

김석일 (수원대학교 전자공학과)
정주영 (수원대학교 전자공학과)
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Abstract
We designed and tested a new scan driver output stage. Compared to conventional CMOS structured scan driver IC′s, the new NMOSFET-only scan driver circuit can reduce the chip area and therefore, the chip cost considerably. We confirmed the circuit operation with open drain power NMOSFET IC′s by driving 2"PDP test panel. We defined critical device parameters and their optimization methods lot the best circuit performance.
Keywords
Dviver IC; PDP; MOSFET; Scan driver; Circuits;
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