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Journal of the Institute of Electronics Engineers of Korea SD  

논문
1 Evidence of Material-dependent and Temperature- dependent Quenching Rates by Infrared Imaging in S.I. GaAs
강성준; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.469-473,
2 Operation of NMOSFET-only Scan Driver IC for AC PDP
김석일;정주영; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.474-480,
3 Fabrication of thin Film Transistor on Plastic Substrate for Application to Flexible Display
배성찬;오순택;최시영; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.481-485,
4 Properties of Pt/${Al_0.33}{Ga_0.67}N$ Schottky Type UV Photo-detector
신상훈;정영로;이재훈;이용현;이명복;이정희;이인환;한윤봉;함성호; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.486-493,
5 Performance Enhancement due to Oxygen Plasma Treatment on the Gate Dielectrics of OTFTs
이명원;김광현;허영헌;안정근; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.494-498,
6 Shift and Noise Tolerance Encryption System Using a Joint Transform Correlator
서동환;김수중; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.499-506,
7 A Study on Design Scheme of Mesh-Based Survivable WDM Networks
현기호;정영철; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.507-517,
8 A High Speed 2D-DWT Parallel Hardware Architecture Using the Lifting Scheme
김종욱;정정화; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.518-525,
9 Reduction of Hardware Overhead for Test Pattern Generation in BIST
김현돈;신용승;김용준;강성호; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.526-531,
10 A Low Power ROM using Charge Recycling and Charge Sharing
양병도;김이섭; / The Institute of Electronics and Information Engineers , v.40, no.7, pp.532-541,