| 1 | Lim, D., D.-G. Seo, and D. Jeong. Defect classification for the inspection of TFT LCD glass. 2005. |
| 2 | Kang, S., et al. Automatic defect classification of TFT-LCD panels using machine learning. in Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on. 2009. IEEE. |
| 3 | Mitchell, T.M., Machine learning. 1997. Burr Ridge, IL: McGraw Hill, 1997. 45. |
| 4 | Burges, C.J., A tutorial on support vector machines for pattern recognition. Data mining and knowledge discovery, 1998. 2(2): p. 121-167. DOI |
| 5 | Hu, M.-K., Visual pattern recognition by moment invariants. Information Theory, IRE Transactions on, 1962. 8(2): p. 179-187. |
| 6 | Guyon, I. and A. Elisseeff, An introduction to variable and feature selection. The Journal of Machine Learning Research, 2003. 3: p. 1157-1182. |
| 7 | Jolliffe, I., Principal component analysis. 2002: Wiley Online Library. |
| 8 | Altman, N.S., An introduction to kernel and nearest-neighbor nonparametric regression. The American Statistician, 1992. 46(3): p. 175-185. |
| 9 | Genuer, R., J.-M. Poggi, and C. Tuleau-Malot, Variable selection using random forests. Pattern Recognition Letters, 2010. 31(14): p. 2225-2236. DOI |
 |
Korea Institute of Science and Technology Information
Gwahangno, Yuseong-gu, Daejeon, 305-806, Korea TEL : +82-42-869-1752
Copyright (c) 2009 KISTI. All Rights Reserved. For more information mail to
webmaster
