1 |
Lim, D., D.-G. Seo, and D. Jeong. Defect classification for the inspection of TFT LCD glass. 2005.
|
2 |
Kang, S., et al. Automatic defect classification of TFT-LCD panels using machine learning. in Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on. 2009. IEEE.
|
3 |
Mitchell, T.M., Machine learning. 1997. Burr Ridge, IL: McGraw Hill, 1997. 45.
|
4 |
Burges, C.J., A tutorial on support vector machines for pattern recognition. Data mining and knowledge discovery, 1998. 2(2): p. 121-167.
DOI
|
5 |
Hu, M.-K., Visual pattern recognition by moment invariants. Information Theory, IRE Transactions on, 1962. 8(2): p. 179-187.
|
6 |
Guyon, I. and A. Elisseeff, An introduction to variable and feature selection. The Journal of Machine Learning Research, 2003. 3: p. 1157-1182.
|
7 |
Jolliffe, I., Principal component analysis. 2002: Wiley Online Library.
|
8 |
Altman, N.S., An introduction to kernel and nearest-neighbor nonparametric regression. The American Statistician, 1992. 46(3): p. 175-185.
|
9 |
Genuer, R., J.-M. Poggi, and C. Tuleau-Malot, Variable selection using random forests. Pattern Recognition Letters, 2010. 31(14): p. 2225-2236.
DOI
|