Nuclear Engineering and Technology

Korean Nuclear Society (한국원자력학회)
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Fault injection and failure analysis on Xilinx 16 nm FinFET Ultrascale+ MPSoC

  • Yang, Weitao (School of Nuclear Science & Technology, Xi'an Jiaotong University) ;
  • Li, Yonghong (School of Nuclear Science & Technology, Xi'an Jiaotong University) ;
  • He, Chaohui (School of Nuclear Science & Technology, Xi'an Jiaotong University)
  • Received : 2021.05.07
  • Accepted : 2021.12.17
  • Published : 2022.06.25
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Abstract

Energetic particle strikes the device and induces data corruption in the configuration memory (CRAM), causing errors and even malfunctions in a system on chip (SoC). Software-based fault injection is a convenient way to assess device performance. In this paper, dynamic partial reconfiguration (DPR) is adopted to make fault injection on a Xilinx 16 nm FinFET Ultrascale+ MPSoC. And the reconfiguration module implements the Sobel and Gaussian image filtering, respectively. Fault injections are executed on the static and reconfiguration modules' bitstreams, respectively. Another contribution is that the failure modes and effects analysis (FMEA) method is applied to evaluate the system reliability, according to the obtained injection results. This paper proposes a software-based solution to estimate programmable device vulnerability.

Keywords

Acknowledgement

Project supported by National Natural Science Foundation of China (Grant Nos. 11575138, 11835006, 11690040, and 11690043), National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Harbin Institute of Technology (Grant No.6142910190304), and China Scholarships Council (Grant No. 201906280343).

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