Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)

The Korean Society Of Semiconductor & Display Technology (한국반도체디스플레이기술학회)
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Optical Investigation and Defect Detection Methods in Polarizing Film on Phase Delay Plates

위상지연판 접합 편광필름의 광학적 고찰 및 결함 검출 방안

  • Joo, Young Bok (Department of Computer Science & Engineering, Korea University of Technology & Education) ;
  • Huh, Kyung Moo (Department of Electronic Engineering, Dankook University)
  • 주영복 (한국기술교육대학교 컴퓨터공학부) ;
  • 허경무 (단국대학교 전자공학과)
  • Received : 2021.10.28
  • Accepted : 2021.12.15
  • Published : 2021.12.31
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Abstract

In this paper, we proposed and implemented defect detection methods of polarized film with half-wave phase retardation plates. We investigated the principles of phase retardation compensation and optical principle of half-wave phase retardation plates. We analyzed of samples of polarized film with half-wave phase retardation plates. The optical defect detection methods are proposed and the performance is validated with experiments.

Keywords

Acknowledgement

이 논문은 2020년도 한국기술교육대학교 교수 교육연구진흥과제 지원에 의하여 연구되었음.

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