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Optical Investigation and Defect Detection Methods in Polarizing Film on Phase Delay Plates  

Joo, Young Bok (Department of Computer Science & Engineering, Korea University of Technology & Education)
Huh, Kyung Moo (Department of Electronic Engineering, Dankook University)
Publication Information
Journal of the Semiconductor & Display Technology / v.20, no.4, 2021 , pp. 55-61 More about this Journal
Abstract
In this paper, we proposed and implemented defect detection methods of polarized film with half-wave phase retardation plates. We investigated the principles of phase retardation compensation and optical principle of half-wave phase retardation plates. We analyzed of samples of polarized film with half-wave phase retardation plates. The optical defect detection methods are proposed and the performance is validated with experiments.
Keywords
defect; detection; half-wave; phase; retardation; plates; polarized; film; double; refraction;
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