Applied Microscopy

  • Volume 50
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  • Pages.14.1-14.6
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  • 2020
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  • 2287-5123(pISSN)
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  • 2287-4445(eISSN)
Korean Society of Microscopy (한국현미경학회)
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Double staining method for array tomography using scanning electron microscopy

  • Eunjin Kim (National Instrumentation Center for Environmental Management, Seoul National University) ;
  • Jiyoung Lee (National Instrumentation Center for Environmental Management, Seoul National University) ;
  • Seulgi Noh (Department of Brain and Cognitive Sciences, Daegu Gyeongbuk Institute of Science & Technology (DGIST)) ;
  • Ohkyung Kwon (National Instrumentation Center for Environmental Management, Seoul National University) ;
  • Ji Young Mun (Neural circuit research group, Korea Brain Research Institute)
  • Received : 2020.04.02
  • Accepted : 2020.06.05
  • Published : 2020.12.31
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Abstract

Scanning electron microscopy (SEM) plays a central role in analyzing structures by imaging a large area of brain tissue at nanometer scales. A vast amount of data in the large area are required to study structural changes of cellular organelles in a specific cell, such as neurons, astrocytes, oligodendrocytes, and microglia among brain tissue, at sufficient resolution. Array tomography is a useful method for large-area imaging, and the osmium-thiocarbohydrazide-osmium (OTO) and ferrocyanide-reduced osmium methods are commonly used to enhance membrane contrast. Because many samples prepared using the conventional technique without en bloc staining are considered inadequate for array tomography, we suggested an alternative technique using post-staining conventional samples and compared the advantages.

Keywords

Acknowledgement

The instruments (scanning electron microscopy) were supplied by the Brain Research Core Facilities at KBRI and NICEM.

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