Fig. 1. Shape of R3216 chip.
Fig. 2. Shape of specimens (a) pure Sn58Bi solder specimensand (b) epoxy solder specimens.
Fig. 3. Schematic diagram of shear test.
Fig. 4. Cross-section images of primary specimens (a) SAC305 solder joint, (b) epoxy SAC305 solder joint, (c) Sn58Bi solder joint, and (d) epoxy Sn58Bi solder joint.
Fig. 5. Intermetallic compound (IMC) layer in SAC305 and SAC305epoxy solder joint (a) before the test in plain solder joint, (b) afterthermal aging test in plain solder joint, (c) before the test in epoxysolder joint, and (d) after thermal aging test in epoxy solder joint.
Fig. 7. Schematic diagram of shear test.
Fig. 8. Graph of shear force drop.
Fig. 9. Fracture surface of SAC305 and SAC305 epoxy solder joint(a) before the ageing test in plain solder joint, (b) after the ageing test in plain solder joint, (c) before the ageing test in epoxy solderjoint, and (d) after the ageing test in epoxy solder joint.
Fig. 10. Fracture surface of Sn58Bi and Sn58Bi epoxy solder joint(a) before the ageing test in plain solder joint, (b) after the ageingtest in plain solder joint, (c) before the ageing test in epoxy solderjoint, and (d) after the ageing test in epoxy solder joint.
Fig. 11. Graph of shear force drop.
Fig. 6. Intermetallic compound (IMC) layer in Sn58Bi and Sn58Bi epoxy solder joint (a) before the test in plain solder joint, (b) after thermal aging test in plain solder joint, (c) before the test in epoxy solder joint, and (d) after thermal aging test in epoxy solder joint.
Table 1. Solder specification.
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