DOI QR코드

DOI QR Code

전자식 점화안전장치 회로 시스템 내부 소자 변화에 따른 민감 소자 확인 및 출력 특성에 대한 신뢰성 분석 프로세스

Identifying Sensitive Components and Analyzing Reliability Process to Output Characteristic for an EAFD Circuit System According to Changes of Internal Component Values

  • 임태흥 (홍익대학교 전자전기공학과) ;
  • 변강일 (UNIST 전기전자컴퓨터공학부) ;
  • 장승교 (국방과학연구소 제4기술연구본부) ;
  • 백승준 (안동대학교 신뢰성교육연구센터) ;
  • 손영갑 (안동대학교 기계자동차공학과) ;
  • 추호성 (홍익대학교 전자전기공학과)
  • Lim, Tae Heung (School of Electronic Electrical Engineering Hongik University) ;
  • Byun, Gangil (School of Electrical & Computer Engineering, UNIST) ;
  • Jang, Seung-gyo (The 4th Research and Development Institute, Agency for Defense Development) ;
  • Back, Seungjun (Reliability Education and Research Center, Andong National University) ;
  • Son, Youngkap (Department of Mechanical & Automotive Engineering, Andong National University) ;
  • Choo, Hosung (School of Electronic Electrical Engineering Hongik University)
  • 투고 : 2018.04.10
  • 심사 : 2018.08.24
  • 발행 : 2018.10.05

초록

In this paper, we analyzed the operation of the ignition circuit for electronic arm and fire device(EAFD), and investigated the sensitive elements of the circuit system. For reliability analysis, the EAFD ignition circuit was modeled using the PSpice simulation tool, and the output results of the circuit were examined by changing the tolerance of each circuit element. Monte Carlo simulation was used by maintaining the values of the observed sensitive elements at ${\pm}10%$ of the original values and adjusting the values of the other components according to a random distribution. The histogram results of the output peak currents and pulse widths were represented by Weibull and Burr type XII function fittings in three cases(element values are +10 %, 0 %, -10 % of original). For the output peak currents, mean values were 1.0028, 1.0034, and 1.0050, where the variance values were calculated as 0.0398, 0.0396, and 0.0290 using the Weibull function fitting, respectively. For pulse widths, the mean values of 0.9475, 0.9907, and 1.0293 with the variance values of 0.0260, 0.0251, and 0.0238 were obtained using the Burr Type XII function fittings.

키워드

참고문헌

  1. S. Jang, H. Lee, J. Oh, and S. Oh, “Design and Output Characteristic Analysis of Electro-Mechanical Ignition Safety Device,” J. of The Korean Society for Aeronautical and Space Science, Vol. 39, No. 12, pp. 1166-1173, 2011. https://doi.org/10.5139/JKSAS.2011.39.12.1166
  2. D. Kim, et. al., "Design and Output Characteristic Analysis of Electro-Mechanical Ignition Safety Device," KSAS 2017 Spring Conference, pp. 150-151, 2017.
  3. G. J. Rohwein, “An Efficient, Power-enhanced Ignition System,” IEEE Trans. Plasma Sci., Vol. 25, No. 2, pp. 306-310, 2011.
  4. X. Zhou, R. Shen, Y. Ye, P. Zhu, Y. Hu and L. Wu, “Influence of Al/CuO Reactive Multilayer Films Additives on Exploding Foil Initiator,” J. Appl. Phys., Vol. 110, No. 9, pp. 1-6, 2011.
  5. S. Jang, J. Hwang and S. Baek, “Analysis on Shock Wave and Sensitivity of Explosives in Through-Bulkhead Initiator,” J. of the Korean Society of Propulsion Engineers, Vol. 21, No. 4, pp. 36-43, 2017. https://doi.org/10.6108/KSPE.2017.21.4.036
  6. B. Yan, J. Qin, Q. Fan and J. B. Bernstein, “Reliability Simulation and Circuit-Failure Analysis in Analog and Mixed-Signal Applications,” IEEE Trans. Device Mater. Reliab., Vol. 9, No. 3, pp. 339-347, 2009. https://doi.org/10.1109/TDMR.2009.2020740
  7. Y. Cheon, et. al., "A Study Of Reliability Check Method for Generator Field Ground Detectors," KIEE 1999 Fall Conference(B), pp. 585-587, 1999.
  8. M. Liu, W. Li, C. Wang, M. P. Polis, L. Y. Wang and J. Li, “Reliability Evaluation of Large Scale Battery Energy Storage Systems,” IEEE Trans. Smart Grid, Vol. 8, No. 6, pp. 2733-2743, 2017. https://doi.org/10.1109/TSG.2016.2536688
  9. J. B. Bernstein, M. Gurfinkel, X. Li, J. Walters, Y Shapira and M Talmor, "Electronic Circuit Reliability Modeling," Microelectron. Reliab., Vol. 46, No. 12 pp. 1597-1979, 2006. https://doi.org/10.1016/j.microrel.2006.07.041
  10. M. G. Pecht and F. R. Nash, “Predicting the Reliability of Electronic Equipment [and prolog],” Proc. IEEE, Vol. 82, No. 7, pp. 992-1004, 1994. https://doi.org/10.1109/5.293157
  11. K. Sheng, S. J. Finney and B. W. Williams, “Fast and Accurate IGBT Model for PSpice,” Electron. Lett., Vol. 32, No. 25, pp. 2294-2295, 1996. https://doi.org/10.1049/el:19961548
  12. R. D. Yates and D. J. Goodman, "Probability and Stochastic Processes: A Friendly Introduction for Electrical and Computer Engineers," John Wiley & Sons, Inc. USA, pp. 286-292, 2005.