Fig. 1. Schematic diagrams illustrating the constitution of a JIC specimen used in this work.
Fig. 2. Small-sized (20 mm × 20 mm) JIC crystallized samples on the 2nd generation glass substrate.
Fig. 3. Raman spectra of JIC poly-Si produced under different processing conditions. (a) 600 V/cm for 15 μs (b) 700 V/ cm for 15 μs, (c) 750 V/cm for 15 μs.
Fig. 4. In-situ, real-time measurement of voltages and currents for a pulsed electric input of 1050 V and 18 μs.
Fig. 5. Bright-field TEM micrograph of the JIC poly-Si produced under different processing conditions. (a) 600 V/cm for 15 μs (b) 700 V/cm for 15 μs, (c) 750 V/cm for 15 μs.
Fig. 6. JIC sample (a) before applying an electric field, and (b) after applying an electric field using the 2nd generation glass substrate. After applying an electric field the complete crystallization on the whole substrate area was successfully accomplished.
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