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Element to Change the Bonding Structures of SnO2 Thin Films

SnO2 박막의 결정에 영향을 주는 요소

  • Oh, Teresa (Dept. of Semiconductor Eng., Cheongju University)
  • Received : 2017.10.16
  • Accepted : 2017.12.07
  • Published : 2018.01.31

Abstract

$SnO_2$ films were annealed in a vaccum atmosphere conditions to research the temperature dependency of current-voltage characteristics in according to the bonding structures. The $SnO_2$ film annealed in a vacuum became an amorphous structure but films annealed in an atmosphere condition had a crystal structure. The defects or depletion layer were formed by the electron-hole combination after annealing processes, and the electrical properties were changed depending on the crystal structure, binding energy and the variation of carriers. $SnO_2$ became more crystal-structural with increasing the annealing temperature, and the current increased at $SnO_2$ film annealed at $150^{\circ}C$ with Schottky current.

$SnO_2$의 결정 변화에 따라서 달라지는 전기적인 특성을 조사하기 위해서 박막의 결정에 영향을 주는 열처릴 온도를 다르게 하여 $SnO_2$을 준비하였다. XRD, 커패시턴스, 전류전압 특성을 조사하여 서로 상관성을 조사하였다. $SnO_2$ 박막은 진공 중에서 열처리를 하면 접합계면에서 pn접합이 생기고 결정내부에는 많은 결함들이 생기면서 이온화에 의해 공핍층이 생성된다. 결함과 공핍층의 형성은 열처리 온도에 따라서 달라지며, 결정성, 결합에너지는 물론 결과적으로 전하량의 변화에 의해 전기적인 특성이 변화하는 것을 알 수 있었다. $SnO_2$ 박막은 열처리하면서 결정성이 높아졌으며, 150도 열처리한 $SnO_2$ 박막에서 쇼키전류가 형성되면서 증가하는 것을 확인하였다.

Keywords

References

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