Fig. 1. Schematic diagram of (a) conventional A-BSF cell structure and (b) PERC
Fig. 2. Four ingot qualities including (a) Oi, (b) Resistivity, (c) Cs, and (d) MCLT (Red numbers show the difference value compared to the value of Group-4 as reference)
Fig. 3. Texturing images of all groups
Fig. 4. MCLT pattern images before and after heat treatment (Red numbers show the difference between value of average MCLTand value of Group-4 as reference)
Fig. 5. Cell performance values including (a) Voc, (b) Isc, (c) FF, and (d) cell efficiency before LID (Red numbers show the difference value from value of Group-4 as reference)
Fig. 6. The (a) LID and (b) cell efficiency after LID (Red numbers show the difference value from value of Group-4 as reference, and LID [%] is percent calculation based on efficiency)
Fig. 7. Relative Voc degradation at elevated temperature of 130℃ with Isc-injection for current equivalent to 1 sun illumination
Fig. 8. The (a) LeTID and (b) cell efficiency after LeTID (Red numbers show the difference value from the value of Group-4 as reference)
Fig. 9. Comparison of LID and LeTID (Blue and red numbers show difference values of LID and LeTID compared to values of Group-4 as reference)
Table 1. Four group conditions
Table 2. Reflectiveness of all groups
References
- Trends 2017 in Photovoltaic Applications Executive Summary, IEA PVPS T1-32, 3, 2017.
- M. Schmela, Global Market Outlook / 2017-2021, Solar Power Europe 13, June, 7, 2017.
- J.S. Hill, Global Solar Market Demand Expected To Reach 100 Gigawatts In 2017, Says Solar Power Europe, Cleantechnica.com, October 27th, 2017.
- K.H. Kim, S.H. Park, J.C. Park, I.S. Pang, S.W. Ryu, J.H. Oh, "Fast pulling of n-type Si ingots for enhanced Si solar cell production," Electron. Mater. Lett. First Online, 15 March, 2018. https://doi.org/10.1007/s13391-018-0040-3.
- J. Schmidt, "Light-induced Degradation in Crystalline Silicon Solar Cells," Solid State Phenom., Vol. 95-96, pp. 187-196, 2004.
- T. Luka, C. Hagendorf, M. Turek, "Multi crystalline PERC solar cells: Is light-induced degradation challenging the efficiency gain of rear passivation?," Photovoltaics International, pp. 43-48, 2016. www.pv-tech.org.
- J. Lindroos, Y. Boulfrad, M. Yli-Koski, H. Savin, "Preventing light-induced degradation in multi crystalline silicon," J. Appl. Phys., Vol. 115, 154902, 2014. https://doi.org/10.1063/1.4871404
- Y. Boulfrad, J. Lindroos, A. Inglese, M. Yli-Koski, H. Savin, "Reduction of light-induced degradation of boron-doped solar-grade Czochralski silicon by corona charging," Energy Proceed., Vol. 38, pp. 531-535, 2013. https://doi.org/10.1016/j.egypro.2013.07.313
- T. Saitoh, "Suppression of light degradation of carrier lifetimes in low-resistivity CZ-Si solar cells," Sol. Energy Mater. Sol. Cells, Vol. 65, pp. 277-285, 2001. https://doi.org/10.1016/S0927-0248(00)00103-3
- S. Togawa, Y. shiraishi, K. Terashima, S. Kimura, "Oxygen Transport Mechanism in Czochralski Silicon Melt," J. Electrochem. Soc., Vol. 142, pp. 2844-2848, 1995. https://doi.org/10.1149/1.2050103
- N. Machida, K. Hoshikawa, Y. Shimizu, "The effects of argon gas flow rate and furnace pressure on oxygen concentration in Czochralski silicon crystals grown in a transverse magnetic field," J. Cryst. Growth, Vol. 210, pp. 532-540, 2000. https://doi.org/10.1016/S0022-0248(99)00516-3
- M. Watanabe, W. Wang, M. Eguchi, T. Hibiya, "Control of oxygen-atom transport in silicon melt during crystal growth by electromagnetic force," Mater. T. JIM, Vol. 41, pp. 1013-1018, 2000. https://doi.org/10.2320/matertrans1989.41.1013
- K.H. Kim, B.C. Sim, I.S. Choi, H.W. Lee, "Point defect behavior in Si crystal grown by electromagnetic Czochralski (EMCZ) method," J. Cryst. Growth, Vol. 299, pp. 206-211, 2007. https://doi.org/10.1016/j.jcrysgro.2006.10.267
- E. Fourmond, M. Forster, R. Einhaus, H. Lauvray, J. Kraiem, M. Lemiti, "Electrical Properties of boron, phosphorus and gallium co-doped silicon," Energy Proced., Vol. 8, pp. 349-354, 2011. https://doi.org/10.1016/j.egypro.2011.06.148
- K. Ram speck, S. Zimmermann, H. Nagel, A. Metz, Y. Gassenbauer, B. Birkmann, A. Seidl, "Light induced degradation of rear passivated mc-Si solar cells," Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt, Germany, pp. 861-865, 2012.
- T. Luka, S. Grober, C. Hagendorf, K. Ram speck, M. Turek, "Intra-grain versus grain boundary degradation due to illumination and annealing behavior of multi-crystalline solar cells," Sol. Energy Mater. Sol. Cells, Vol. 158, pp. 43-49, 2016. https://doi.org/10.1016/j.solmat.2016.05.061
- T. Luka, M. Turek, S. Grober, C. Hagendorf, "Microstructural identification of Cu in solar cells sensitive to light-induced degradation," Phys. Status Solidi RRL, Vol. 11, 1600426, 2017. https://doi.org/10.1002/pssr.201600426
- F. Kersten, P. Engelhart, H.C. Ploigt, A. Stekolnikov, T. Lindner, F. Stenzel, M. Bartzsch, A. Szpeth, K. Peter, J. Heitmann, J.W. Muller, "Degradation of multi crystalline silicon solar cells and modules after illumination at elevated temperature," Sol. Energy Mater. Sol. Cells, Vol. 142, pp. 83-86, 2015. https://doi.org/10.1016/j.solmat.2015.06.015
- F. Kersten, P. Engelhart, H.C. Ploigt, F. Stenzel, K. Peter, T. Lindner, A. Szpeth, M. Bartzsch, A. Stekolnikov, M. Scherff, J. Heitmann, J.W. Muller, "A new light induced volume degradation effect of mc-Si solar cells and modules", 31st European Photovoltaic Solar Energy Conference, Hamburg, Germany, September, pp. 14-18, 2015.
- F. Kersten, F. Fertig, K. Petter, B. Kloter, E. Herzog, M.B. Strobel, J. Heitmann, J.W. Muller, "System performance loss due to LeTID", Energy Proced., Vol. 124, pp. 540-546, 2017. https://doi.org/10.1016/j.egypro.2017.09.260
- J. Schmidt, D. Bredemeier, D.C. Walter, "Improved understanding of light-induced degradation and regeneration in multi crystalline silicon solar cells," 27th International Photovoltaic Science and Engineering Conference, Shiga, Japan, 2017.
- F. Fertig, R. Lantzsch, A. Mohr, M. Schaper, M. Bartzsch, D. Wissen, F. Kersten, A. Mette, S. Peters, A. Eidner, J. Cieslak, K. Duncker, M. Junghanel, E. Jarzembowski, M. Kauert, B.F. Quandt, D. Meibner, B. Reiche, S. Geibler, S. Homlein, C. Klenke, L. Niebergall, A. Schonmann, A. Weihrauch, F. Stenzel, A. Hofmann, T. Rudoph, A. Schwabedissen, M. Gundermann, M. Fischer, J.W. Muller, D.J.W. Jeong, "Mass production of p-type Cz silicon solar cells approaching average stable conversion efficiencies of 22%," Energy Proced., Vol. 124, pp. 338- 345, 2017. https://doi.org/10.1016/j.egypro.2017.09.308
- R. Eberle, W. Kwapil, F. Schindler, M.C. Schunbert, S.W. Glunz, "Impact of the firing temperature profile on light induced degradation of multi crystalline silicon," Phys. Status Solidi RRL, Vol. 10, pp. 861-865, 2016. https://doi.org/10.1002/pssr.201600272
- A. Inglese, A. Focareta, F. Schindler, J. Schon, J. Lindroos, M.C. Schubert, H. Savin, "Light-induced degradation in multi crystalline silicon : the role of copper," Energy Proced., Vol. 92, pp. 808-814, 2016. https://doi.org/10.1016/j.egypro.2016.07.073
- D.N.R. Payne, C.E. Chan, B.J. Hallam, B. Hoex, M.D. Abbott, S.R. Wenham, D.M. Bagnall, "Rapid passivation of carrier-induced defects in p-type multi-crystalline silicon," Sol. Energy Mater. Sol. Cells, Vol. 158, pp. 102-106, 2016. https://doi.org/10.1016/j.solmat.2016.05.022
- W. Kwapil, T. Niewelt, M.C. Schubert, "Kinetics of carrier-induced degradation at elevated temperature in multi crystalline silicon solar cells," Sol. Energy Mater. Sol. Cells, Vol. 173, pp. 80-84, 2017. https://doi.org/10.1016/j.solmat.2017.05.066
- R. Eberle, W. Kwapil, F. Schindler, M.C. Schunbert, S.W. Glunz, M.C. Schubert, "Firing temperature profile impact on light induced degradation in multi crystalline silicon," Energy Proced., Vol. 124, pp. 712-717, 2017. https://doi.org/10.1016/j.egypro.2017.09.082
- D.B.M. Klaassen, "A unified mobility model for device simulation-II. Temperature dependence of carrier mobility and lifetime," Solid-State Electron., Vol. 35, pp. 961-967, 1992. https://doi.org/10.1016/0038-1101(92)90326-8
- J. Haunschild, I.E. Reis, J. Geilker, S. Rein, "Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging," Phys. Status Solidi RRL, Vol. 5, pp. 199-201, 2011. https://doi.org/10.1002/pssr.201105183
- T.S. Boscke, D. Kania, A. Helbig, C. Schollhorn, M. Dupke, P. Sadler, M. Braun, T. Roth, D. Stichtenoth, T. Wutherich, R. Jesswein, D. Fiedler, R. Carl, J. Lossen, A. Grohe, H.J. Krokoszinski, "Bifacail n-Type cells with >20% front-side efficiency for industrial production," IEEE J. Photovolt., Vol. 3, pp. 674-677, 2013. https://doi.org/10.1109/JPHOTOV.2012.2236145
- M. Turek, C. Hagendorf, T. Luka, R. Meier, H. Hanifi, M. Glaser, D. Lausch, I. Kruse, "Light-induced degradation newly addressed-predicting long-term yield loss of high-performance PV modules," www.pv-tech.org/Technical Briefing/SystemIntegration, May, pp. 1-5, 2017.