Journal of the Institute of Electronics and Information Engineers (전자공학회논문지)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Accuracy Evaluation of the FinFET RC Compact Parasitic Models through LNA Design

LNA 설계를 통한 FinFET의 RC 기생 압축 모델 정확도 검증

  • Jeong, SeungIk (College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Kim, SoYoung (College of Information and Communication Engineering, Sungkyunkwan University)
  • 정승익 (성균관대학교 정보통신대학) ;
  • 김소영 (성균관대학교 정보통신대학)
  • Received : 2016.05.16
  • Accepted : 2016.10.18
  • Published : 2016.11.25
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Abstract

Parasitic capacitance and resistance of FinFET transistors are the important components that determine the frequency performance of the circuit. Therefore, the researchers in our group developed more accurate parasitic capacitance and resistance for FinFETs than BSIM-CMG. To verify the RF performance, proposed model was applied to design an LNA that has $S_{21}$ more than 10dB and center frequency more than 60GHz using HSPICE. To verify the accuracy of the proposed model, mixed-mode capability of 3D TCAD simulator Sentaurus was used. $S_{21}$ of LNA was chosen as a reference to estimate the error. $S_{21}$ of proposed model showed 87.5% accuracy compared to that of Sentaurus in 10GHz~100GHz frequency range. The $S_{21}$ accuracy of BSIM-CMG model was 56.5%, so by using the proposed model, the accuracy of the circuit simulator improved by 31%. This results validates the accuracy of the proposed model in RF domain and show that the accuracies of the parasitic capacitance and resistance are critical in accurately predicting the LNA performance.

FinFET의 기생 커패시턴스와 기생저항은 회로의 고주파 성능을 결정하는 매우 중요한 요소이다. 선행 연구에서 BSIM-CMG에 구현된 FinFET의 기생 커패시턴스와 저항 모델보다 더 정확한 압축 모델을 개발하였다. 모델의 정확도를 검증하고, FinFET으로 구현 가능한 RF 회로의 성능을 정확하게 예측하기 위해 $S_{21}$ 10dB 이상 중심 주파수 60GHz 이상을 갖는 Low Noise Amplifier (LNA) 에 설계하였다. 22 nm FinFET 소자의 압축모델에 기반한 HSPICE를 사용하여 예측한 회로 성능의 정확도를 검증하기 위해 3D TCAD simulator인 Sentaurus의 mixed-mode 기능을 사용하여 LNA를 시뮬레이션 하였다. TCAD 시뮬레이션 결과를 정확도 측정의 기준으로 삼아 10GHz~100GHz 대역에서 제안한 모델과 Sentaurus의 $S_{21}$을 비교한 결과 87.5%의 정확도를 달성하였다. 이는 기존의 BSIM-CMG의 기생성분으로 예측한 정확도가 56.5%도임에 비해 31% 향상된 정확도를 보여준다. 이를 통해 FinFET의 기생 성분 모델의 정확도를 RF 영역에서 확인하였고, 정확한 기생 저항과 커패시턴스 모델이 LNA 성능을 정확하게 예측하는데 중요한 것임을 확인하였다.

Keywords

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