센서학회지 (Journal of Sensor Science and Technology)

  • 제24권5호
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  • Pages.348-352
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  • 2015
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  • 1225-5475(pISSN)
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  • 2093-7563(eISSN)
한국센서학회 (The Korean Sensors Society)
권호 표지
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Resistivity Variation of Nickel Oxide by Substrate Heating in RF Sputter for Microbolometer

  • Lee, Yong Soo (Institute of Semiconductor Fusion Technology, College of Engineering, Kyungpook National Unversity)
  • 투고 : 2015.07.31
  • 심사 : 2015.09.18
  • 발행 : 2015.09.30
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초록

Thin nickel oxide films formed on uncooled and cooled $SiO_2/Si$ substrates using a radio frequency (RF) magnetron sputter powered by 200 W in a mixed atmosphere of argon and oxygen. Grazing-incidence X-ray diffraction and field emission scanning electron microscopy are used for the structural analysis of nickel oxide films. The electrical conductivity required for better bolometric performance is estimated by means of a four-point probe system. Columnar and (200) preferred orientations are discovered in both films regardless of substrate cooling. Electric resistivity, however, is greatly influenced by the substrate cooling. Oxygen partial pressure increase during the nickel oxide deposition leads to a rapid decrease in resistivity, and the resistivity is higher in the cooled nickel oxide samples. Even when small microstructure variations are applied, lower resistivity in favor of low noise performance is acquired in the uncooled samples.

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