한국정보전자통신기술학회논문지 (The Journal of Korea Institute of Information, Electronics, and Communication Technology)

  • 제8권2호
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  • Pages.107-115
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  • 2015
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  • 2005-081X(pISSN)
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  • 2288-9302(eISSN)
한국정보전자통신기술학회 (Korea Information Electronic Communication Technology)
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Power IC용 저면적 Differential Paired eFuse OTP 메모리 설계

Deign of Small-Area Differential Paired eFuse OTP Memory for Power ICs

  • 투고 : 2015.04.02
  • 심사 : 2015.04.10
  • 발행 : 2015.04.28
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⟨ 이전 논문 다음 논문 ⟩

초록

본 논문에서는 Power IC용 저면적 32비트 differential paired eFuse OTP 메모리를 설계하였다. OTP 메모리 셀 어레이에서 행의 개수가 열의 개수보다 더 작은 경우 eFuse 링크의 프로그램 전류를 공급하는 SL (Source Line) 구동 라인을 열 방향으로 라우팅하는 대신 행 방향으로 라우팅하므로 레이아웃 면적을 많이 차지하는 SL 구동회로의 수를 줄이는 differential paired eFuse 셀 어레이 방식과 코어 회로를 제안하였다. 그리고 blowing되지 않은 eFuse 링크가 EM (Electro-Migration) 현상에 의해 blowing되는 불량을 해결하기 위해 RWL (Read Word-Line) 구동 회로와 BL (Bit-Line) 풀-업 부하회로에 V2V ($=2V{\pm}0.2V$)의 regulation된 전압을 사용하였다. 설계된 32비트 eFuse OTP 메모리의 레이아웃 면적은 $228.525{\mu}m{\times}105.435{\mu}m$으로 기존의 셀 어레이 라우팅을 이용한 IP 크기인 $197.485{\mu}m{\times}153.715{\mu}m$ 보다 20.7% 더 작은 것을 확인하였다.

In this paper, a small-area 32-bit differential paired eFuse OTP memory for power ICs is designed. In case of smaller number of rows than that of columns for the OTP memory cell array, a scheme for the cell array reducing the number of SL driver circuits requiring their larger layout areas by routing the SL (source line) lines supplying programming currents for eFuse links in the row direction instead of the column direction as well as a core circuit is proposed. In addition, to solve a failure of being blown for non-blown eFuse links by the electro-migration phenomenon, a regulated voltage of V2V ($=2V{\pm}0.2V$) is used to a RWL (read word line) driver circuit and a BL (bit line) pull-up driver circuit. The layout size of the designed 32-bit eFuse OTP memory is $228.525{\mu}m{\times}105.435{\mu}m$, which is confirmed to be 20.7% smaller than that of the counterpart using the conventional cell array routing, namely $197.485{\mu}m{\times}153.715{\mu}m$.

키워드

참고문헌

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