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Program Cache Busy Time Control Method for Reducing Peak Current Consumption of NAND Flash Memory in SSD Applications

  • 투고 : 2013.11.05
  • 심사 : 2014.05.17
  • 발행 : 2014.10.01

초록

In current NAND flash design, one of the most challenging issues is reducing peak current consumption (peak ICC), as it leads to peak power drop, which can cause malfunctions in NAND flash memory. This paper presents an efficient approach for reducing the peak ICC of the cache program in NAND flash memory - namely, a program Cache Busy Time (tPCBSY) control method. The proposed tPCBSY control method is based on the interesting observation that the array program current (ICC2) is mainly decided by the bit-line bias condition. In the proposed approach, when peak ICC2 becomes larger than a threshold value, which is determined by a cache loop number, cache data cannot be loaded to the cache buffer (CB). On the other hand, when peak ICC2 is smaller than the threshold level, cache data can be loaded to the CB. As a result, the peak ICC of the cache program is reduced by 32% at the least significant bit page and by 15% at the most significant bit page. In addition, the program throughput reaches 20 MB/s in multiplane cache program operation, without restrictions caused by a drop in peak power due to cache program operations in a solid-state drive.

키워드

참고문헌

  1. K. Takeuchi, "Novel Co-Design of NAND Flash Memory and NAND Flash Controller Circuits for Sub-30 nm Low-Power High-Speed Solid-Stage Drives (SSD)," IEEE J. Solid-State Circuits, vol. 44, no. 4, Apr. 2009, pp. 1227-1234. https://doi.org/10.1109/JSSC.2009.2014027
  2. T. Cho et al., "A 3.3 V 1 Gb Multi-level NAND Flash Memory with Non-Uniform Threshold Voltage Distribution," Proc. IEEE ISSCC, San Francisco, CA, USA, Feb. 7, 2001, pp. 28-29.
  3. T. Cho et al., "A Dual-Mode NAND Flash Memory: 1-Gb Multilevel and High-Performance 512-Mb Single-Level Modes," IEEE J. Solid-State Circuits, vol. 36, no. 11, Nov. 2001, pp. 1700-1706. https://doi.org/10.1109/4.962291
  4. C. Trinh et al., "A 5.6 MB/s 64 Gb 4 b/Cell NAND Flash Memory in 43 nm CMOS," Proc. IEEE ISSCC, San Franciso, CA, USA, Feb. 8-12, 2009, pp. 246-247.
  5. C. Lee et al., "A 32-Gb MLC NAND Flash Memory with Vth Endurance Enhancing Schemes in 32 nm CMOS," IEEE J. Solid-State Circuits, vol. 46, no. 1, Jan. 2011, pp. 97-106. https://doi.org/10.1109/JSSC.2010.2084450
  6. K. Fukuda et al., "A $151-mm^2$ 64-Gb 2 Bit/Cell NAND Flash Memory in 24-nm CMOS Technology," IEEE J. Solid-State Circuits, vol. 47, no. 1, Jan. 2012, pp. 75-84. https://doi.org/10.1109/JSSC.2011.2164711
  7. K. Imamiya et al., "A $125-mm^2$ 1-Gb NAND Flash Memory with 10-MByte/s Program Speed," IEEE J. Solid-State Circuits, vol. 37, no. 11, Nov. 2002, pp. 1493-1501. https://doi.org/10.1109/JSSC.2002.802355
  8. R.H. Fowler and L. Nordheim, "Electron Emission in Intense Electric Fields," Proc. Royal Soc., May 1, 1928, pp. 173-181.
  9. K. Suh et al., "A 3.3 V 32 Mb NAND Flash Memory with Incremental Step Pulse Programming Scheme," Proc. IEEE ISSCC, San Francisco, CA, USA, Feb. 15-17, 1995, pp. 128-129.