참고문헌
- J. Jang, et al, "Vertical cell array using TCAT (Terabit Cell Array Transistor) technology for ultra high density NAND flash memory," in VLSI Symp. Tech. Dig., pp. 192-193, month 2008.
- Y. Kim, et al, "Three-Dimensional NAND Flash Architecture Design Based on Single-Crystalline STacked ARray," IEEE Trans. Electron Devices, vol. 59, no. 1, pp. 35-45, Jan. 2012. https://doi.org/10.1109/TED.2011.2170841
- W. Kim, et al, "Channel-stacked NAND flash memory with layer selection by multi-level operation (LSM)," in IEDM Tech. Dig., 2013, pp. 3.8.1-3.8.4.
- Y. Kim, M. Kang, S. H. Park, and B.-G. Park, "Three-Dimensional NAND Flash Memory Based on Single-Crystalline Channel Stacked Array," IEEE Electron Device Lett., vol. 34, no. 8, pp. 990-992, July. 2013. https://doi.org/10.1109/LED.2013.2262174
- K.-D. Suh, et al, "A 3.3 V 32 Mb NAND Flash memory with incremental step pulse programming scheme," in ISSCC Dig. Tech., pp. 128-129, Feb. 1995.
피인용 문헌
- Gated twin-bit silicon–oxide–nitride–oxide–silicon NAND flash memory for high-density nonvolatile memory vol.54, pp.6, 2015, https://doi.org/10.7567/JJAP.54.064201
- Effect of Bottom Electrode on Resistive Switching Voltages in Ag-Based Electrochemical Metallization Memory Device vol.16, pp.2, 2016, https://doi.org/10.5573/JSTS.2016.16.2.147
- Down-Coupling Phenomenon of Floating Channel in 3D NAND Flash Memory vol.37, pp.12, 2016, https://doi.org/10.1109/LED.2016.2619903
- Layer Selection by Multi-Level Permutation in 3-D Stacked NAND Flash Memory vol.37, pp.7, 2016, https://doi.org/10.1109/LED.2016.2568171
- Highly compact and accurate circuit-level macro modeling of gate-all-around charge-trap flash memory vol.56, pp.1, 2016, https://doi.org/10.7567/JJAP.56.014302
- Bias Polarity Dependent Resistive Switching Behaviors in Silicon Nitride-Based Memory Cell vol.E99.C, pp.5, 2016, https://doi.org/10.1587/transele.E99.C.547
- Investigation of Retention Characteristics for Trap-Assisted Tunneling Mechanism in Sub 20-nm NAND Flash Memory vol.17, pp.4, 2017, https://doi.org/10.1109/TDMR.2017.2772046
- Natural Local Self-Boosting Effect in 3D NAND Flash Memory vol.38, pp.9, 2017, https://doi.org/10.1109/LED.2017.2736541
- -based resistive random-access memory with MIS structure vol.33, pp.6, 2015, https://doi.org/10.1116/1.4931946
- Modeling of apparent activation energy and lifetime estimation in NAND flash memory vol.30, pp.12, 2015, https://doi.org/10.1088/0268-1242/30/12/125006
- -based resistive-switching random-access memory cell with tunnel barrier for high density integration and low-power applications vol.106, pp.21, 2015, https://doi.org/10.1063/1.4921926
- -based resistive random-access memory cell with Ti buffer layer vol.34, pp.2, 2016, https://doi.org/10.1116/1.4943560
- /TiN structures vol.108, pp.21, 2016, https://doi.org/10.1063/1.4952719
- 3-D Floating-Gate Synapse Array With Spike-Time-Dependent Plasticity vol.65, pp.1, 2018, https://doi.org/10.1109/TED.2017.2775233