Journal of Institute of Control, Robotics and Systems (제어로봇시스템학회논문지)

Institute of Control, Robotics and Systems (제어로봇시스템학회)
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Reliability Analysis of Interleaved Memory with a Scrubbing Technique

인터리빙 구조를 갖는 메모리의 스크러빙 기법 적용에 따른 신뢰도 해석

  • Ryu, Sang-Moon (Dept. of Control and Robotics Engineering, Kunsan National University)
  • 류상문 (군산대학교 제어로봇공학과)
  • Received : 2013.06.13
  • Accepted : 2013.12.16
  • Published : 2014.04.01
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Abstract

Soft errors in memory devices that caused by radiation are the main threat from a reliability point of view. This threat can be commonly overcome with the combination of SEC (Single-Error Correction) codes and scrubbing technique. The interleaving architecture can give memory devices the ability of tolerating these soft errors, especially against multiple-bit soft errors. And the interleaving distance plays a key role in building the tolerance against multiple-bit soft errors. This paper proposes a reliability model of an interleaved memory device which suffers from multiple-bit soft errors and are protected by a combination of SEC code and scrubbing. The proposed model shows how the interleaving distance works to improve the reliability and can be used to make a decision in determining optimal scrubbing technique to meet the demands in reliability.

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References

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