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과도방사선 검출을 위한 핵폭발 검출기 제작 및 검증

A Nuclear Event Detectors Fabrication and Verification for Detection of a Transient Radiation

  • 정상훈 (전북대학교 전자정보공학부) ;
  • 이승민 (충남대학교 사범대학 전기전자통신공학교육과) ;
  • 이남호 (한국원자력연구원 융합기술개발부) ;
  • 김하철 (해군사관학교 전기전자공학과) ;
  • 조성익 (전북대학교 전자공학부)
  • Jeong, Sang-Hun (Dept. of Electronic Engineering, Chonbuk National University, Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute) ;
  • Lee, Seung-Min (Dept., of Electric, Electronics & Communication Engineering Education, Chungnam National University) ;
  • Lee, Nam-Ho (Dept. of Nuclear Convergence Technology Development Korea Atomic Energy Research Institute) ;
  • Kim, Ha-Chul (Dept. Electrical Engineering, Republic of Korea Naval Academy) ;
  • Cho, Seong-Ik (Dept. of Electronic Engineering, Chonbuk National University)
  • 투고 : 2013.01.15
  • 심사 : 2013.04.16
  • 발행 : 2013.05.01

초록

In this paper, proposed NED(nuclear event detectors) for detection of a transient radiation. Nuclear event detector was blocked of power temporary for defence of critical damage at a electric device when a induced transient radiation. Conventional NED consist of BJT, resistors and capacitors. The NED supply voltage of 5V and MCM(Multi Chip Module) structures. The proposed NED were designed for low supply voltage using 0.18um CMOS process. The response time of proposed NED was 34.8ns. In addition, pulse radiation experiments using a electron beam accelerator, the output signal has occurred.

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참고문헌

  1. George C Messenger, "The effects of radiation on electronic systems", New York : Van Nostrand Reinhold, cop., 1992.
  2. Lewis Cohn, Manfred Espig, Al Wolicki, Mayrant Simons, Clay Rogers, Alfred Costantine, "Transient Radiation Effects on Electronics(TREE) Handbook", Defence Nuclear Agency, 1996.
  3. Larry L., "NUCLEAR EVENT DETECTOR", http://www.freepatentsonline.com/, Aug 1987.
  4. Seungchan Oh, Namho Lee, Heungho Lee, "The Study of Transient Radiation Effects on Commercial Electronic Devices" Thh Transactions of the Korean Institute of Electrical Engineers, V.61, no.10, 2012, pp.1448-1453 https://doi.org/10.5370/KIEE.2012.61.10.1448
  5. Namho Lee, Younggwan Hwang, Jongryul Kim, Sanghun Jeong, Seungchan Oh, "A Study on Implementation of Transient Radiation Effects on Electronics(TREE) Assessment System" Journal of the Korea Institute of Information and Communication Engineering, V.16 no.10, 2012, pp.2329-2334 https://doi.org/10.6109/jkiice.2012.16.10.2329