Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Improvement of Alignment Accuracy in Electron Tomography

  • Jou, Hyeong-Tae (Maritime Security Center, Korea Institute of Ocean Science & Technology) ;
  • Lee, Sujeong (Mineral Resources Research Division, Korea Institute of Geoscience and Mineral Resources) ;
  • Kim, Han-Joon (Maritime Security Center, Korea Institute of Ocean Science & Technology)
  • Received : 2013.01.22
  • Accepted : 2013.03.12
  • Published : 2013.03.30
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Abstract

We developed an improved method for tilt series alignment with fiducial markers in electron tomography. Based on previous works regarding alignment, we adapted the Levenberg-Marquardt method to solve the nonlinear least squares problem by incorporating a new formula for the alignment model. We also suggested a new method to estimate the initial value for inversion with higher accuracy. The proposed approach was applied to geopolymers. A better alignment of the tilt series was achieved than that by IMOD S/W. The initial value estimation provided both stability and a good rate of convergence since the new method uses all marker positions, including those partly covering the tilt images.

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