전기학회논문지 (The Transactions of The Korean Institute of Electrical Engineers)

  • 제61권10호
  • /
  • Pages.1448-1453
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  • 2012
  • /
  • 1975-8359(pISSN)
  • /
  • 2287-4364(eISSN)
대한전기학회 (The Korean Institute of Electrical Engineers)
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즉발감마선에 의한 상용전자소자의 피해현상분석 연구

The Study of Transient Radiation Effects on Commercial Electronic Devices

  • 오승찬 (충남대학교 공대 전기공학과) ;
  • 이남호 (한국원자력연구원) ;
  • 이흥호 (충남대학교 공대 전기공학과)
  • 투고 : 2012.08.03
  • 심사 : 2012.08.29
  • 발행 : 2012.10.01
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초록

In this study, we carried out transient radiation test for identify failure situation by a transient radiation effect on operational amplifier devices. This experiments were carried out using a 60 MeV electron beam pulse of the LINAC(Linear Accelerator) facility in the Pohang Accelerator Laboratory. In this test, we has found that a serious failure as a burn-out effect due to overcurrent on the partial electronic devices.

키워드

참고문헌

  1. Lewis Cohn and Al Wolicki and Mayrant Simons and Clay Rogers and Alfred Costantine, "Transient Radiation Effects on Electronics (TREE) Handbook ", Defense Nuclear Agency 6801 Telegraph Road Alexandria, VA 2231-3398, December 1995
  2. MIL-STD-883G 1020.1, "Dose rate induced latchup test procedure", (28, February 2006)
  3. MIL-STD-883G 1021.2 "Dose rate upset testing of ditital microcircuits", (28, February 2006)
  4. OH S.C, Lee,N.H, Lee H.H, "Investigation of Transient Radiation Effects in CMOS ICS Using the TCAD Simulation and Experiment" Juornal of the Korea Physical Society, Vol.59, No.2, August, 2011
  5. George C. Messenger and Milton S. Ash, "The Effects of Radiation On Electronic Systems", VAN NOSTRAND REINHOLD COMPANY, New York, May 14, 1992

피인용 문헌

  1. The Development of Beam Profiling System for the Analysis of Pulsed Gamma-ray Using the Electron Accelerator vol.20, pp.12, 2016, https://doi.org/10.6109/jkiice.2016.20.12.2410
  2. A Nuclear Event Detectors Fabrication and Verification for Detection of a Transient Radiation vol.62, pp.5, 2013, https://doi.org/10.5370/KIEE.2013.62.5.639
  3. The Study of Radiation Hardened Common Sensor Circuits using COTS Semiconductor Devices for the Nuclear Power Plant vol.63, pp.9, 2014, https://doi.org/10.5370/KIEE.2014.63.9.1248
  4. A Design of High-speed Power-off Circuit and Analysis vol.63, pp.4, 2014, https://doi.org/10.5370/KIEE.2014.63.4.490
  5. Implementation of the Radiation Protection Module for Electronic Equipment from Pulsed Radiation and Its Function Tests vol.62, pp.10, 2013, https://doi.org/10.5370/KIEE.2013.62.10.1421