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http://dx.doi.org/10.5370/KIEE.2012.61.10.1448

The Study of Transient Radiation Effects on Commercial Electronic Devices  

Oh, Seugn-Chan (충남대학교 공대 전기공학과)
Lee, Nam-Ho (한국원자력연구원)
Lee, Heung-Ho (충남대학교 공대 전기공학과)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.61, no.10, 2012 , pp. 1448-1453 More about this Journal
Abstract
In this study, we carried out transient radiation test for identify failure situation by a transient radiation effect on operational amplifier devices. This experiments were carried out using a 60 MeV electron beam pulse of the LINAC(Linear Accelerator) facility in the Pohang Accelerator Laboratory. In this test, we has found that a serious failure as a burn-out effect due to overcurrent on the partial electronic devices.
Keywords
Pulsed gamma-ray; Transient radiation effect; Total ionizing dose effect;
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  • Reference
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