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3 |
MIL-STD-883G 1021.2 "Dose rate upset testing of ditital microcircuits", (28, February 2006)
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4 |
OH S.C, Lee,N.H, Lee H.H, "Investigation of Transient Radiation Effects in CMOS ICS Using the TCAD Simulation and Experiment" Juornal of the Korea Physical Society, Vol.59, No.2, August, 2011
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5 |
George C. Messenger and Milton S. Ash, "The Effects of Radiation On Electronic Systems", VAN NOSTRAND REINHOLD COMPANY, New York, May 14, 1992
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