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Design Approach and Structural Analysis for Development of a Micro-Wear Tester

마이크로 마모 시험기 개발을 위한 설계 방안 및 구조 해석

  • Received : 2012.03.12
  • Accepted : 2012.03.23
  • Published : 2012.03.25

Abstract

The tribological behavior of microsystems needs to be clearly understood in order to improve the reliability of precision components. For example, friction and wear phenomena pose serious problems in MEMS applications. As a first step to investigate the tribological behavior of such systems, an appropriate testing system must be acquired. In this work, a micro-wear tester based MEMS platform was designed. The main concern was to achieve a desirable range of horizontal displacement for the specimen holder and also to apply a normal force in the tens of ${\mu}N$ range. The structural analysis of the micro-wear tester showed that the proposed design satisfied these requirements while maintaining the structural integrity.

Keywords

References

  1. S. Kamisuki, M. fujii, T. Takekoshi, C. Tezuka, M. Atobe and M. A. Green, 2000, "A high resolution, electrostatically-driven commercial inkjet head", Micro Electro Mechanical System, The Thirteenth Anuual Interantional Conference on, pp. 793-798.
  2. X. Xiong, Y. Wu and W. B. Jone, 2008, "Material fatigue and reliability of MEMS accelerometers", Defect and Fault Tolerance of VLSI Systems, IEEE International Symposium on, pp. 314-322.
  3. P.F. Van Kessel, L. J. Hornbeck, R.E. Meier and M.R. Douglass, 1998, "A MEMS-based projection display", IEEE Transactions on Electron Devices, Vol. 86, No.8, pp.1687-1704.
  4. G. Binning and C. F. Quate, 1986, "Atomic Force Microscope", Physical Review Letters, Vol. 56, No. 9, pp. 930-933. https://doi.org/10.1103/PhysRevLett.56.930
  5. O. Marti, B. Drake, S. Gould and P. K. Hansma, 1986, "Atomic resolution atomic force microscopy of graphite and the ''native oxide'' on silicon", Journal of Vacuum Science & Technology A : Vacuum, Surfaces, and Films, Vol. 6, No. 2, pp. 287-290.
  6. K. H. Chung and D. E. Kim, 2005, "Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip", Ultramicroscopy, Vol. 102, pp. 161-171. https://doi.org/10.1016/j.ultramic.2004.09.009
  7. H. J. Kim and D. E. Kim, 2009, "Manufacturing-nano-scale friction: a review", International Journal of Precision Engineering, Vol.10, pp.141-151. https://doi.org/10.1007/s12541-009-0039-7
  8. N. S. Tambe and B. Bhushan, 2004, "Scale dependence of micro/nano-friction and adhesion of MEMS/NEMS materials, coatings and lubricants", Nanotechnology, Vol.15, pp.1561-1570. https://doi.org/10.1088/0957-4484/15/11/033
  9. A.V. Desai and M. A. Haque, 2004, "A novel MEMS nano-tribometer for dynamic testing in-situ in SEM and TEM", Tribology Letters, Vol.18, No.1, pp.13-19.
  10. W. M. van Spengen and J. W. M. Frenken, 2007, "The Leiden MEMS tribometer : real time dynamic friction loop measurements with an on-chip tribometer", Tribology Letters, Vol.28, pp.149-156. https://doi.org/10.1007/s11249-007-9259-0
  11. H. Yu, G. Zhou, X. Chew, S. K. Sinha and F. S. Chau, 2011, "Nano-tribometer integrated with a nano-photonic displacement sensing mechanism", Journal of Micromechanics and Microengineering, Vol. 21, pp. 1-9.
  12. S. W. Yoon, 2009, "Vibration isolation and shock protection for MEMS", ProQuest.
  13. R. Legthenberg, A. W. Groeneveld and M. Elwenspoek, 1996, "Comb-drive actuators for large displacement", J. Micromech. Micoeng. Vol. 6, pp. 320-329. https://doi.org/10.1088/0960-1317/6/3/004
  14. J. Y. Wong, 1993, "Theory of ground vehicles, 2 edtion.", John Wiley & Sons.