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Growth of O- and Zn-polar ZnO films by DC magnetron sputtering

  • Yoo, Jin-Yeop (Department of Nano-semiconductor Engineering, National Korea Maritime University) ;
  • Choi, Sung-Kuk (Department of Nano-semiconductor Engineering, National Korea Maritime University) ;
  • Jung, Soo-Hoon (Department of Nano-semiconductor Engineering, National Korea Maritime University) ;
  • Cho, Young-Ji (Department of Nano-semiconductor Engineering, National Korea Maritime University) ;
  • Lee, Sang-Tae (Department of Offshore Plant Management, National Korea Maritime University) ;
  • Kil, Gyung-Suk (Division of Electrical and Electronics Engineering, National Korea Maritime University) ;
  • Lee, Hyun-Jae (PAN-Xal Co., Ltd.) ;
  • Yao, Takafumi (Center for Interdisciplinary Research, Tohoku University) ;
  • Chang, Ji-Ho (Department of Nano-semiconductor Engineering, National Korea Maritime University)
  • Received : 2011.10.12
  • Accepted : 2011.11.18
  • Published : 2012.02.29

Abstract

O- and Zn-polar ZnO films were grown by DC magnetron sputtering. Growth of high-quality, single-crystal ZnO thin films were confirmed by XRD and pole figure analysis. O-polar ZnO was grown on an $Al_2O_3$ substrate, which was confirmed by a slow growth rate (378 nm/hr), a fast etching rate (59 nm/min), and by the hillocks on the surface after etching. Zn-polar ZnO was grown on a GaN/$Al_2O_3$ substrate, which was confirmed by a fast growth rate (550 nm/hr), a slow etching rate (28 nm/min), and by pits on the surface after etching. Results from the present study show that it is possible to use DC-sputtering to grow ZnO film with the same polarity as other epitaxial growth methods.

Keywords

References

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