Journal of the Microelectronics and Packaging Society (마이크로전자및패키징학회지)

The Korean Microelectronics and Packaging Society (한국마이크로전자및패키징학회)
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Electrically Programmable Fuse - Application, Program and Reliability

전기적 프로그램이 가능한 퓨즈 - 응용, 프로그램 및 신뢰성

  • 김덕기 (세종대학교 전자공학과)
  • Received : 2012.08.30
  • Accepted : 2012.09.07
  • Published : 2012.09.30
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Abstract

Technology trend and application of laser fuse, anti-fuse, and eFUSE as well as the structure, programming mechanism, and reliability of eFUSE have been reviewed. In order to ensure eFUSE reliability in the field, a sensing circuit trip point consistent with the fuse resistance distribution, process variation, and device degradation in the circuit such as hot carrier or NBTI, as well as fuse resistance reliability must be considered to optimize and define a reliable fuse programming window.

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References

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