Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
권호 표지

Accuracy Improvement of Lattice Parameters Measured from Electron Diffraction Data

전자회절을 이용한 격자상수의 측정 정확도 향상

  • Lee, Sang-Gil (Division of Electron Microscopic Research, Korea Basic Science Institute) ;
  • Song, Kyung (Division of Electron Microscopic Research, Korea Basic Science Institute) ;
  • Kim, Jin-Gyu (Division of Electron Microscopic Research, Korea Basic Science Institute)
  • Received : 2011.02.27
  • Accepted : 2011.03.21
  • Published : 2011.03.31
Download PDF
⟨ Previous Next ⟩

Abstract

For quantitative analysis of nano-crystal structure, we reported the accuracy improvement method of lattice parameters measured from electron diffraction. For calculation of Au lattice parameters used as a standard crystal structure, it was considered two different acquisition methods (detector and enegy-filter) and three different calculation methods (conventional, least-square and regression fit). As a result, the measurement reliability could be enhanced by using CCD camera which gives higher performance, while energy-filtering did not affect the improvement the camera constant accuracy. Also, the accuracy of lattice parameters could be improved up to $10^{-4}$ order by regression fitting with correction formula. Finally, it is expected that the combination of regression fitting and intensity extraction from energy-filtered precession electron diffraction gives a solution of quantitative structure analysis for unknown nano-crystals.

Keywords

References

  1. Ahn JP, Park JK: Electron diffraction and nanostructural analysis in electron microscope. Ploymer Science and Technology 17(4) : 493-510, 2006.
  2. Kim JG, Seo JW, Cheon JW, Kim YJ: Rietveld analysis of nanocrystalline MnFe2O4 with electron powder diffraction. Bull Korean Chem Soc 30 : 183-187, 2009. https://doi.org/10.5012/bkcs.2009.30.1.183
  3. Kim JG, Song K, Kwon KH, Hong KM, Kim YJ: Structure analysis of inorganic crystals by energy-filtered precession electron diffraction. J Electron Microscopy 59(4) : 273-283, 2010. https://doi.org/10.1093/jmicro/dfq006
  4. Schamp CT, Jesser WA: On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffraction. Ultramicroscopy 103 : 165-172, 2005. https://doi.org/10.1016/j.ultramic.2004.11.007
  5. Song K, Kim YJ, Kwon KH, Kim JG, Moon SM, Cho NH: Structure determination of nano-crystalline, $BaTiO_3$, using precession electron diffraction. Korean J. Microscopy 39(4) : 341-348, 2009.
  6. Vincent R, Bird DM: Measurement of kinematic intensities from large-angle electron-diffraction patterns. Philos Mag Lett 53 : L35-L40, 1986.
  7. Vincent R, Midgley PA: Double conical beam-rocking system for measurement of integrated electron diffraction intensities. Ultramicroscopy 53 : 271-282, 1994. https://doi.org/10.1016/0304-3991(94)90039-6
  8. Zou XD, Sukharev Y, Hovmöller S: ELD-a computer program system for extracting intensities from electron diffraction patterns. Ultramicroscopy 49 : 147-158, 1993. https://doi.org/10.1016/0304-3991(93)90221-I