DOI QR코드

DOI QR Code

A Programmable Compensation Circuit for System-on-Chip Application

  • Choi, Woo-Chang (MEMS/NANO Fabrication Center, Busan Techno-Park) ;
  • Ryu, Jee-Youl (Information and Communications Engineering, Pukyong National University)
  • 투고 : 2011.05.25
  • 발행 : 2011.09.30

초록

This paper presents a new programmable compensation circuit (PCC) for a System-on-Chip (SoC). The PCC is integrated with $0.18-{\mu}m$ BiCMOS SiGe technology. It consists of RF Design-for-Testability (DFT) circuit, Resistor Array Bank (RAB) and digital signal processor (DSP). To verify performance of the PCC we built a 5-GHz low noise amplifier (LNA) with an on-chip RAB using the same technology. Proposed circuit helps it to provide DC output voltages, hence, making the RF system chain automatic. It automatically adjusts performance of an LNA with the processor in the SoC when it goes out of the normal range of operation. The PCC also compensates abnormal operation due to the unusual PVT (Process, Voltage and Thermal) variations in RF circuits.

키워드

참고문헌

  1. J.-Y. Ryu, S.-W. Kim, D.-H Lee, S.-H. Park, J.-H. Lee, D.-H Ha, and S.-U. Kim, "Programmable RF System for RF System-On-Chip," 2010 International Conference on Future Generation Communication and Networking, pp.311-315, 2010.
  2. J.-Y. Ryu, B.C. Kim, "Low-cost test technique using a new rf bist circuit for 4.5-5.5 GHz low noise amplifiers," Microelectronics Journal: Circuits and Systems, Vol.36, pp.770-777, 2005.
  3. M. Pronath, V. Gloeckel, and H. Graeb, "A Parametric Test Method for Analog Components in Integrated Mixed-signal Circuits," IEEE/ACM International Conference on Computer Aided Design, pp.557-561, 2000.
  4. H. -C. H. Liu and M. Soma, "Fault Diagnosis for Analog Integrated Circuits based on the Circuit Layout," Proceedings of Pacific Rim International Symposium on Fault Tolerant Systems, pp.134-139, 1991
  5. J. Segura, A. Keshavarzi, J. Soden and C. Hawkins, "Parametric Failures in CMOS ICs - a Defectbased Analysis," Proceedings of International Test Conference, pp.90-99, 2002.
  6. J. Ferrario, R. Wolf and S. Moss, "Architecting Millisecond Test Solutions for Wireless Phone RFICs," Proceedings of the 2003 International Test Conference, pp.1325-1332, 2003.
  7. E. P. Vandamme, M. P. Schreurs and C. van Dinther, "Improved Three-step De-embedding Method to Accurately Account for the Influence of Pad Parasitics in Silicon on-wafer RF Teststructures," IEEE Transactions on Electronic Devices, Vol.48, pp.137-142, 2001.
  8. K. C. Craig, S. P. Case, R. E. Neese and C. D. DePriest, "Current and Future Trusting in Automated RF and Microwave Testing," IEEE Proceedings, pp.183-192, 1994.
  9. F. R. de Sousa and B. Huyart, "A Reconfigurable High-Frequency Phase-Locked Loop," IEEE Transactions on Instrumentation and Measurement, Vol.53, pp.1035-1039, 2004. https://doi.org/10.1109/TIM.2004.831141
  10. J. Y. Ryu, and B. C. Kim, "A New Design for Built-In Self-Test of 5GHz Low Noise Amplifiers," Proceedings of IEEE International System-On- Chip Conference, pp.324-327, 2004.
  11. B. Razavi, RF Microelectronics: Prentice-Hall, Inc., New Jersey, USA, 1998.
  12. J.-Y. Ryu and S.-H. Noh, "New Programmable RF DFT Circuit for Low Noise Amplifiers," Journal of the Institute of Electronics Engineering of Korea, Vol.44, No.4, pp.28-39, April, 2007.

피인용 문헌

  1. A 2 GHz 20 dBm IIP3 Low-Power CMOS LNA with Modified DS Linearization Technique vol.16, pp.4, 2016, https://doi.org/10.5573/JSTS.2016.16.4.443
  2. An Integrated High Linearity CMOS Receiver Frontend for 24-GHz Applications vol.16, pp.5, 2016, https://doi.org/10.5573/JSTS.2016.16.5.595