DOI QR코드

DOI QR Code

신뢰성 평가를 위한 자동차 전장 부품의 기계적 접합강도 특성 및 오차범위에 관한 연구

A Study on the Characteristics and Error Ranges of Automotive Application Component's Mechanical Bonding Strength for the Its Reliability Evaluation

  • Jeon, Yu-Jae (School of Mechanical Engineering, Chung-Ang University) ;
  • Kim, Do-Seok (School of Mechanical Engineering, Chung-Ang University) ;
  • Shin, Young-Eui (School of Mechanical Engineering, Chung-Ang University)
  • 투고 : 2011.11.03
  • 심사 : 2011.11.21
  • 발행 : 2011.12.01

초록

In this study, the characteristics and error ranges of the mechanical bonding strength were analyzed according to before and after thermal shock test for various chips of automotive application component using Sn-3.0Ag-0.5Cu solder. In the after thermal shock test, the mechanical bonding strengths tend to decrease, meanwhile decreasing rates of mechanical strengths were less then 12% at specimen's bonding area below 3.5$mm^2$, and were from 17 to 21% at specimen's bonding area above 12 $mm^2$. On the other hand, Specimen's mean deviation rates were about 5% at specimen's bonding area more than 12 $mm^2$. Inversely, at specimen's bonding area is less then 3.5 $mm^2$, mean deviation rates were increased to about 8%. It means that the smaller device size is, the larger mean deviation rate. In addition, error ranges and deviation rates of the mechanical bonding strengths may differ slightly depending on their bonding area. Furthermore, process conditions as well as method of mechanical reliability evaluation should be established to reduce the error ranges of bonding strength.

키워드

참고문헌

  1. Y. J. Jeon, S. I. Son, D. S. Kim, and Y. E. Shin, J. KIEEME, 23, 611 (2010).
  2. Y. E. Shin and S. J Hwang, J. KIEEME, 16, 549 (2003).
  3. W. B. Hampshire, The Search for Leadfree Solders (Soldering & Surface Mount Technology, MCB University Press, 1993) p. 49.
  4. S. S. Ha, J. W. Kim, and S. B. Jung, Journal of Korean Welding Society, 24, 457 (2006).
  5. J. S. Park, I. J. Cho, and Y. E. Shin, J. KIEEME, 22, 199 (2009).
  6. JIS Z 3198-6, Translated and Published by Japanese Standards Association (2003).
  7. JIS Z 3198-7, Translated and Published by Japanese Standards Association (2003).
  8. M. Yunus, K. Srihari, J. M. Pitarresi, and A. Primavera, Microelectron. Reliab., 43, 2077 (2003). https://doi.org/10.1016/S0026-2714(03)00124-0