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광대역 고출력 전자기 펄스에 의한 마이크로컨트롤러 소자의 매개변수들의 민감성 분석

The Sensitivity of the Parameters of Microcontroller Device with Coupling Caused by UWB-HPEM (Ultra Wideband-High Power Electromagnetics)

  • 발행 : 2010.02.01

초록

Modem electronic circuits are of importance for the function of communication, traffic systems and security systems. An intentional threat to these systems could be of big casualties and economic disasters. This paper has shown damage effect of microcontroller device with coupling caused by UWB-HPEM(Ultra Wideband-High Power Electromagnetics). The UWB measurements were done at an Anechoic Chamber using a RADAN UWB voltage source, which can generate a transient impulse of about 180 kV. The susceptibility level for microcontroller has been assessed by effect of various operation line lengths. The results of susceptibility analysis has showed that the effect of the reset line length on the MT(Ma1function Threshold) is larger than the effect of the different line length(Data, Power, Clock). With the knowledge of these parameters electronic system can be designed exactly suitable concerning the system requirements. Based on the results, susceptibility of microcontroller can be applied to protection plan to elucidate the effects of microwaves on electronic equipment.

키워드

참고문헌

  1. Electromagnetic compatibility (EMC)- Part 1-5 : High power electromgnetic (HPEM) effects on civil systems, IEC 61000-1-5 2004
  2. Clayborne D. Talyer, D. V. Giri, "High-Power Microwave Systems and Effects", Taylor&Fransis, 1994
  3. Mats G. Backstrom, "Susceptibility of Electronic Systems to High Power Microwaves: Summary of Test Experience" IEEE Transactions on Electromagnetic Compatibility, Vol. 46, NO. 3, Augst 2004
  4. William A. Radasky, Carl E. Baum, and Manuem W. Wik, "Introduction to the Special Issue on High-Power Electromagnetics (HPEM) and Intentional Electromagnetic Interference (IEMI)", IEEE Trans. on Electromagnetic Compatibility, Vol. 46, 2004
  5. S. M. Hwang, J. I. Hong, and C. S. Huh, "Characterization of The Susceptibility of Integrated Circuits with Induction caused by High Power Microwaves, Progress In Electromagnetics Research, PIER, Vol. 81, 61–72, 2008
  6. Kyechong Kim Iliadis, A.A., "Critical Upsets of CMOS Inverters in Static Operation Due to High-Power Microwave Interference", Electromagnetic Compatibility, IEEE Transactions on, Vol. 49, Issue 4, Nov. 2007
  7. Camp, M., H. Gerth, H. Garbe, and H. Haase, "Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis," IEEE Trans. on Electromagnetic Compatibility, Vol. 46, 368-79, 2004. https://doi.org/10.1109/TEMC.2004.831816
  8. Richard L. Burden, J. Douglas Faires, "Numerical analysis" pp. 484-493