1 |
Kyechong Kim Iliadis, A.A., "Critical Upsets of CMOS Inverters in Static Operation Due to High-Power Microwave Interference", Electromagnetic Compatibility, IEEE Transactions on, Vol. 49, Issue 4, Nov. 2007
|
2 |
Richard L. Burden, J. Douglas Faires, "Numerical analysis" pp. 484-493
|
3 |
William A. Radasky, Carl E. Baum, and Manuem W. Wik, "Introduction to the Special Issue on High-Power Electromagnetics (HPEM) and Intentional Electromagnetic Interference (IEMI)", IEEE Trans. on Electromagnetic Compatibility, Vol. 46, 2004
|
4 |
Electromagnetic compatibility (EMC)- Part 1-5 : High power electromgnetic (HPEM) effects on civil systems, IEC 61000-1-5 2004
|
5 |
Mats G. Backstrom, "Susceptibility of Electronic Systems to High Power Microwaves: Summary of Test Experience" IEEE Transactions on Electromagnetic Compatibility, Vol. 46, NO. 3, Augst 2004
|
6 |
Clayborne D. Talyer, D. V. Giri, "High-Power Microwave Systems and Effects", Taylor&Fransis, 1994
|
7 |
Camp, M., H. Gerth, H. Garbe, and H. Haase, "Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis," IEEE Trans. on Electromagnetic Compatibility, Vol. 46, 368-79, 2004.
DOI
ScienceOn
|
8 |
S. M. Hwang, J. I. Hong, and C. S. Huh, "Characterization of The Susceptibility of Integrated Circuits with Induction caused by High Power Microwaves, Progress In Electromagnetics Research, PIER, Vol. 81, 61–72, 2008
|