References
- Meeker, W. Q. and Escobar, L. A., 1993, "A Review of Recent Research and Current Issues in Accelerated Testing," International Statistical Review, Vol 61, No.1, pp.147-168 https://doi.org/10.2307/1403600
- Li, J. and Dasgupta, A., 1993, "Failure- Mechanism Models for Creep and Creep Rupture," IEEE Trans. on reliability, Vol 42, No.3, pp.339-353 https://doi.org/10.1109/24.257816
- Kim, I. H., Park, T. S. and Lee, S. B., 2004, "A Comparative Study of the Fatigue Behavior of SnAgCu and Snpb Solder Joints," Trans.of the KSME(A), Vol. 28, No. 12, pp. 1856-1863 https://doi.org/10.3795/KSME-A.2004.28.12.1856
- Lee, S. C., Hyun, C. M., Lee, H. M., Kim, M. J., Kim, H. K. and Kim, K. T., 2004, "Thermal Fatigue Reliability of Solder Joints in a Thin Film Optical Filter Device," Trans.of the KSME(A), Vol. 28, No. 6, pp. 677-684 https://doi.org/10.3795/KSME-A.2004.28.6.677
- www.matweb.com
- Tee, T.Y., Ng, H. S. and Zhong, Z., 2006, "Board Level Solder Joint Reliability Analysis of Stacked Die Mixed Flip-chip and Wirebond BGA," Micro- electronics Reliability, Vol. 46, No. 12, pp. 2131-2138 https://doi.org/10.1016/j.microrel.2006.01.010
- Amagai, M., 1999, "Chip Scale Package Solder Joint Reliability and Modeling," Microelectronics Reliability, Vol. 39, No. 4, pp. 463-477 https://doi.org/10.1016/S0026-2714(99)00017-7
- Pecht, M., Agarwal, R., McCluskey, P., Dishongh T., Javadpur, S. and Mahajan, R., 1998, Electronic Packaging Materials and their Properties, CRC Press
- Pang, J.H.L., Seetoh, C.W. and Wang, Z.P., 2000, "CBGA Solder Joint Reliability Evalulation Based on Elastic-Plastic-Creep Analysis," Journal of Electronic Packaging, Vol. 122, No. 3, pp. 255-261 https://doi.org/10.1115/1.1286120
- Zhao, J.-H., Dai, X. and Ho, P., 1998, "Analysis and Modeling Verification for Thermal Mechanical Deformation in Flip chip Packages," Proc. of 48th Electronic Components and Technology Conference, pp. 336-344
- Bhandarkar, S.M., Dasgupta, A., Barker, D., Pecht, M. and Engelmaier, W., 1992, "Influence of Selected Design Variables on Thermo-mechanical Stress Distributions in Plated-through-hole Structures," Journal of Electronic Packaging, Vol. 114, No.1, pp. 8-13. https://doi.org/10.1115/1.2905447
- Anand, L., 1982, "Constitutive Equations for the Rate-Dependent Deformation of Metals at Elevated Temperatures," ASME Journal of Engineering Materials and Technology, Vol. 104, pp. 12-17 https://doi.org/10.1115/1.3225028
- Wilde, J., Becker, K., Thoben, M., Blum, W., Jupitz, T., Wang, G. and Cheng, Z.N., 2000 "Rate-Dependent Constitutive Relations Based on Anand Model for 92.5Pb5Sn2.5Ag Solder," IEEE Transaction on Advanced Packaging, Vol. 23, No. 3, pp. 408-414 https://doi.org/10.1109/6040.861554
- Cheng, Z.N., Wang, G.Z., Chen, L., Wilde, J. and Becker, K., 2000, "Viscoplastic Anand Model for Solder Alloys and its Application," Soldering and Surface Mount Technology, Vol. 12, No. 2, pp. 31-36 https://doi.org/10.1108/09540910010331428
- Darveaux R., 2000, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation", Proc. of 50th Electronic Components and Technology Conference, pp. 1048-1058
- Wang, G.Z., Cheng, Z.N., Becker, K. and Wilde, J., 2001, "Applying Anand Model to Represent the Viscoplastic Deformation Behavior of Solder Alloys," Journal of Electronic Packaging, Vol. 123, pp. 247-253 https://doi.org/10.1115/1.1371781
- Yeo, A., Lee. C. and Pang, H. L., 2006, "Flip Chip Solder Reliability Analysis Using Viscoplastic and Elastic-Plastic-Creep Constitutive Models," IEEE Trans. Comp. Pack. Tech., Vol. 29, No. 2, pp. 355-363 https://doi.org/10.1109/TCAPT.2006.875893