참고문헌
- 노병욱, 'PCB패턴의 고속정밀 vision검사 시스템 개발,' 전자부품종합기술연구소(KETI) 연구보고서, KETIRD-94037, 1994년 8월
- 고낙훈, 이승걸, 박세근, 이일항, 최태일, 서승원, 'BRDF 측정을 통한 PCB 표면의 광 산란 특성 연구,' 한국광학회 2008 동계학술발표회, pp. 427-428, 2008
- R. L. Cook and K. E. Torrance, 'A reflectance model for computer graphics,' Computer Graphics, vol. 15, no. 3, pp. 307-316, 1981 https://doi.org/10.1145/965161.806819
- H. Ragheb and E. R. Hancock, 'The modified Beckmann-Kirchhoff scattering theory for rough surface analysis,' Pattern Recognition, vol. 40, no. 1, pp. 2004-2020, 2007 https://doi.org/10.1016/j.patcog.2006.10.007
- J. E. Harvey, A. Krywonos, and C. L. Vernold, 'Modified Beckmann-Kirchhoff scattering theory for rough surfaces with large scattering and incident angles,' Opt. Eng., vol. 46, no. 7, 078002, 2007 https://doi.org/10.1117/1.2752180
- P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (MacMillan/Pergamon, New York, 1963), pp. 70-96
- X. D. He, K. E. Torrance, F. X. Sillion, and D. P. Greenberg, 'A comprehensive physical model for light reflection,' Computer Graphics, vol. 25, no. 4, pp. 175-186, 1991 https://doi.org/10.1145/127719.122738
- Y. Sun, 'Statistical ray method for deriving reflection models of rough surfaces,' J. Opt. Soc. Am. A, vol. 24, no. 3, pp. 724-744, 2007 https://doi.org/10.1364/JOSAA.24.000724
- I. G. E. Renhorn and G. D. Boreman, 'Analytical fitting model for rough-surface BRDF,' Opt. Exp., vol. 16, no. 17, pp. 12892-12898, 2008 https://doi.org/10.1364/OE.16.012892
- J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Opt. Soc. of Am., Washington D.C., 1999), pp. 20-70
- C. B. Rao and B. Raj, 'Study of engineering surfaces using laser-scattering techniques,' Sadhana, vol. 28, part 3&4, pp. 739-761, 2003 https://doi.org/10.1007/BF02706457
- A. Ishimaru, Wave Propagation and Scattering in Random Media (Academic Press, New York, NY, 1978), pp. 463-492
- 최명조, '고니어 방식을 이용한 편광 산란 특성 측정,' 인하대학교 석사학위논문, 2008년 8월
피인용 문헌
- Ray Tracing-based Simulation of Image Formation in an Equipment for Automated Optical Inspection vol.20, pp.4, 2009, https://doi.org/10.3807/KJOP.2009.20.4.223