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http://dx.doi.org/10.3807/HKH.2009.20.2.134

Measurement and Analysis of Light Scattering of Au Pads on PCB Surface to Extract Scattering Parameters  

Ko, Nak-Hoon (SEM Co. - Inha Univ. Precision Inspection and Measurement Center (PIMC))
Park, Dae-Seo (SEM Co. - Inha Univ. Precision Inspection and Measurement Center (PIMC))
Kim, Young-Seok (Optics and Photonics Elite Research Academy (OPERA), Inha University)
O, Beom-Hoan (SEM Co. - Inha Univ. Precision Inspection and Measurement Center (PIMC))
Park, Se-Geun (Optics and Photonics Elite Research Academy (OPERA), Inha University)
Lee, El-Hang (Optics and Photonics Elite Research Academy (OPERA), Inha University)
Lee, Seung-Gol (SEM Co. - Inha Univ. Precision Inspection and Measurement Center (PIMC))
Choi, Tae-Il (SAMSUNG ELECTRO-MECHANICS CO., LTD.)
Publication Information
Korean Journal of Optics and Photonics / v.20, no.2, 2009 , pp. 134-140 More about this Journal
Abstract
In this study, the influence of surface roughness on light scattering from Au pads on a PCB surface was investigated. Angular distributions of light scattered from Au pads with different surface roughness were measured for several incident angles. Diffusely-scattered light could be separated by using the fact that the amount of specularly-scattered light was directly related to surface roughness. The separated diffuse term was curve-fitted with a physics-based model, and then the related scattering parameters were extracted and compared with measured parameters.
Keywords
BRDF; Surface scattering; Surface roughness; PCB;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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