Optimization of Cleaning Parameters in Cryogenic $CO_2$ Cleaning Process

극저온 $CO_2$ 세정공정의 세정인자 최적화

  • Published : 2008.09.01

Abstract

The cleaning process of contaminant particles adhering to the microchips, integrated circuits (ICs) or the like is essential in modern microelectronics industry. In the cleaning process particularly working with the application of inert gases, the removal of contaminant particles of submicron scale is very difficult because the particles are prone to reside inside the boundary layer of the working fluid, The use of cryogenic $CO_2$ cleaning method is increasing rapidly as an alternative to solve this problem. In contrast to the merits of high efficiency of this process in the removal of minute particles compared to the others, even fundamental parametric studies for the optimal process design in this cleaning process are hardly done up to date, In this study, we attempted to measure the cleaning efficiency with the variations of some principal parameters such as mass flow rate, injection distance and angle, and tried to draw out optimal cleaning conditions by measuring and evaluating an effective cleaning width called $d_{50}$.

Keywords

References

  1. Hattori, T., "Contamination control: problems and prospects," Solid State Technol., Vol. 33, No. 7, pp. 1-8, 1990. https://doi.org/10.1016/0038-1101(90)90002-V
  2. Hattori, T. and Koyate, S., "An automated particle detection and identification system in VLSI wafer processing," Solid State Technol., Vol. 34, No. 9, pp. 1-6, 1991. https://doi.org/10.1016/0038-1101(91)90195-5
  3. Maboudian, R., Ashurst, W. R. and Carraro, C., "Self-assembled monolayers as anti-stiction coatings for MEMS: characteristics and recent developments," Sensors and Actuators A, Vol. 82, No. 1, pp. 219-223, 2000. https://doi.org/10.1016/S0924-4247(99)00337-4
  4. Zhao, Y. P., "Morphological stability of epitaxial thin elastic films by van der waals force," Arch. Appl. Mech., Vol. 72, No. 1, pp. 77-84, 2002. https://doi.org/10.1007/s004190100194
  5. Sung, U. C., Yoon, C. N. and Kim, S. G., "Surface cleaning by ice-particle jet( ): preparation of contaminated surface and its cleaning," Korean J. of Chem. Eng., Vol. 14, No. 1, pp. 15-22. 1997. https://doi.org/10.1007/BF02706036
  6. Linger, D. R., "CO2(dry-ice) particle blasting as a mainstream cleaning alternative," Particles on Surfaces 5&6: Detection, Adhesion and Removal, K. L. Mittal(Ed.), pp. 203-220, 1999.
  7. Spur, G., Uhlmann, E. and Elbing, F., "Dry-ice blasting for cleaning: process, optimization, and application," Wear, Vol. 233, No. 235, pp. 402-411, 1999. https://doi.org/10.1016/S0043-1648(99)00204-5
  8. Na, Y. M., Kim, H. and Kim, S. G., "Measurement of coating removal rate of accelerated dry ice snow impact," Clean Technol, Vol. 10, No. 4, pp. 177-187, 2004.
  9. Banerjee, S. and Campbell, A., "Principles and mechanisms of sub-micrometer particle removal by CO2 cryogenic technique," J. Adhes. Sci. Technol, Vol. 19, No. 9, pp 739-752, 2005. https://doi.org/10.1163/1568561054867828
  10. Narayanswami, N., Heitzinger, J., Partrin, J., Rader, D., O'Hern, T. and Torczynski, J., "Development and optimization of a cryogenic aerosol-based wafer cleaning system," Particles on Surfaces: Detection, Adhesion and Removal, pp. 251-266, 1999.
  11. Na, Y., "The cleaning rate of injection jet using dry ice snow producted high pressure liquid expansion," Master dissertation, Choong-Ang Univ., 2003.
  12. Trezona, R. I. and Hutchings, I. M., "Resistance of paint coatings to multiple solid particle impact: effect of coating thickness and substrate material," Progress in Organic Coatings, Vol. 41, No. 1, pp. 85-92, 2001. https://doi.org/10.1016/S0300-9440(00)00154-5