Estimation of Nanomechanical Properties of Nanosurfaces Using Phase Contrast Imaging in Atomic Force Microscopy

원자력현미경의 위상차영상을 이용한 나노표면의 미소기계적 특성 평가

  • 안효석 (서울산업대학교 나노아이티공학과)
  • Published : 2007.10.15

Abstract

Phase contrast imaging in atomic force microscopy showed a promise as an effective tool for better understanding of micromechanical properties of surfaces at nano scale. A qualitative estimation model for phase contrast images obtained with a tapping mode AFM was developed. This investigation demonstrated the high efficiency of combined analysis of topography and phase contrast images for characterizing nanosurfaces. Phase contrast images allowed estimation of relative stiffness(elastic modulus) of the sample surface. The phase contrast images revealed a significant inhomogeneity of the nano scale worn surfaces. Phase contrast images are also capable of revealing the formation of tribofilms.

Keywords

References

  1. Marti, O., 1993, 'Nanotribology: Friction on a Nanometer Scale,' Physica Scripta, Vol. T49, pp. 599-604
  2. Binggeli, M. and Mate, C. M., 1994, 'Influence of Capillary Condensation of Water on Nanotribology Studied by Force Microscopy,' Applied Physics Letters, Vol. 65, pp. 415-417
  3. Bhushan, B., Israelachvili, J. N. and Landman, U., 1995, 'Nanotribology: Friction, Wear, and Lubrication at the Atomic Scale,' Nature, Vol. 374, pp. 607-616 https://doi.org/10.1038/374607a0
  4. Gibson, C. T., Watson, G. S. and Myhra, S., 1997, 'Lateral Force Microscopy - A Quantitative Approach,' Wear, Vol. 213, pp. 72-79 https://doi.org/10.1016/S0043-1648(97)00175-0
  5. Burnham, N. and Colton, R. J., 1989, 'Measuring the Nanomechanical Properties and Surface Forces of Materials Using an Atomic Force Microscope,' Journal of Vacuum Science and Technology, Vol. A7, pp. 2906-2913
  6. Sarid, D., 1994, Scanning Force Microscopy, Oxford University Press, New York, pp. 120-135
  7. Sarid, D., 1997, Exploring Scanning Probe Microscopy, John Wiley & Sons, Inc., New York, pp. 136-145
  8. Sarid, D., Ruskell, T. G., Workman, R. K. and Chen, D., 1996, 'Driven Nonlinear Atomic Force Microscopy Cantilevers: From noncontact to tapping modes of operation,' Journal of Vacuum Science and Technology, Vol. B14, pp. 864-867
  9. Whangbo, M. H., Bar, G. and Brandsh, R., 1998, 'Description of Phase Imaging in Tapping Mode Atomic Force Microscopy by Harmonic Approximation,' Surface Science Letters, Vol. 411, pp. L794-L801 https://doi.org/10.1016/S0039-6028(98)00349-5
  10. Bar, G., Brandsh, R. and Whangbo, M. H., 1998, 'Description of the Frequency Dependence of the Amplitude and Phase Angle of a Silicon Cantilever Tapping on a Silicon Substrate by Harmonic Aapproximation,' Surface Science Letters, Vol. 411, pp. L802-L809 https://doi.org/10.1016/S0039-6028(98)00348-3
  11. Barnham, N. A., Behrend, O. P., Oulevey, F., Gremaud, G., Gallo, P. J., Gourdon, D., Dupas, E., Kulik, A. J., Pollock, H. M. and Briggs, G. A. D, 1997, 'How Does a Tip Tap?,' Nanotechnology, Vol. 8, pp. 67-75 https://doi.org/10.1088/0957-4484/8/2/004
  12. Chen, X., Davies, M. C., Roberts, C. J., Tendler, S. J. B., Williams, P. M., Davies, J., Dawkes, A. C. and Edwards, J. C., 1998, 'Interpretation of Tapping Mode Atomic Force Microscopy Data Using Amplitudephase- distance Measurements,' Ultramicroscopy, Vol. 75, pp. 171-181 https://doi.org/10.1016/S0304-3991(98)00068-0
  13. Cleveland, J. P., Anczykowski, B., Schmid, A. E. and Elings, V. B., 1998, 'Energy Dissipation in Tapping-mode Atomic Force Microscopy,' Applied Physics Letters, Vol. 72, pp. 2613-2615 https://doi.org/10.1063/1.121434
  14. Wang, L., 1998, 'Analytical Discriptions on the Tapping-mode Atomic Force Microscopy,' Applied Physics Letters, Vol. 73, pp. 3781-3783 https://doi.org/10.1063/1.122893
  15. Bar, G., Brandsh, R. and Whangbo, M. H., 1999, 'Correlation Between Frequency-sweep Hysteresis and Phase Imaging Instability in Tapping Mode Atomic Force Microscopy,' Surface Science Letters, Vol. 436, pp. L715-L723 https://doi.org/10.1016/S0039-6028(99)00702-5
  16. Bar, G., Brandsh, R. and Whangbo, M. H., 1999, 'Effect of Tip Sharpness on the Relative Contributions of Attractive and Repulsive Forces in the Phase Imaging of Tapping Mode Atomic Force Microscopy,' Surface Science Letters, Vol. 422, pp. L192-L199 https://doi.org/10.1016/S0039-6028(98)00899-1
  17. Wang, L., 1999, 'The Role of Damping in Phase Imaging in Tapping Mode Atomic Force Microscopy,' Surface Science, Vol. 429, pp. 178-185 https://doi.org/10.1016/S0039-6028(99)00368-4
  18. Huhnt, J. P. and Sarid, D., 1998, 'Kinetics of Lossy Grazing Impact Oscillators,' Applied Physics Letters, Vol. 72, pp. 2969-2671 https://doi.org/10.1063/1.121510
  19. Anczykowski, B., Gotsman, B., Fuchs, H., Cleveland, J. P. and Elings, V. B., 1999, 'How to Measure Energy Dissipation in Dynamic Mode Atomic Force Microscopy,' Applied Surface Science, Vol. 140, pp. 376-382 https://doi.org/10.1016/S0169-4332(98)00558-3
  20. Magonov, S. N., Elings, V. and Whangbo, M. H., 1997, 'Phase Imaging and Stiffness in Tapping-mode Atomic Force Microscopy,' Surface Science Letters, Vol. 375, pp. L385-L391 https://doi.org/10.1016/S0039-6028(96)01286-1