반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)
- 제6권4호
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- Pages.33-38
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- 2007
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- 1738-2270(pISSN)
습식화학법을 이용한 고순도 석영유리 기판 제조 및 특성평가
Preparation and Characterization of High-purity Quartz Panel Using Wet-chemical Method
- Park, Sung-Eun (SEBIT) ;
- Nam, Byeong-Uk (Korea university of technology and education) ;
- An, Jung-Sook (SEBIT) ;
- Shin, Ji-Shik (SEBIT) ;
- Oh, Han-Seog (SEBIT)
- 발행 : 2007.12.30
초록
Quartz glass panel was prepared by a colloidal silica through the heat-treatment only without any additives in wet-chemical method. This colloidal silica used in slurry process has the uniform distribution of particle size and lower cost. The results show that 6N as a degree of purity and the 86 percentage of violet transmittance in 1mm thickness. AFM(Atomic Force Microscopy) pattern shows that the surface roughness are less than lnm. Also, we investigated the characteristic of quartz panel according to the concentration and distribution of hydroxyl group, viscosity and thermal expansion coefficient.