Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Design of Built-In-Self-Repair Circuit for Embedded Memory Using 2-D Spare Memory

2차원 여분 메모리를 이용한 내장메모리의 자가치유회로 설계

  • Published : 2007.12.25
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Abstract

This paper proposes a built-in-self-repair (BISR) structure using 2-dimensional spare memory to effectively self-repair faults of an embedded memory. In case of multiple faults in the same row (column) of an embedded memory, the previous method using 1-D spare column (row) memory needs the same number of spare memory columns (rows) as the number of faults to self-repair them. while the new method using 2-D spare memory needs only one spare row (column) to self-repair them. Also, the virtual divided memory is adopted to be able to self-repair using not a full spare column memory but the only partial spare column memory corresponding to the faults. A self-repair circuit with $64\times1-bit$ core memory and $2\times8$ 2-D spare memory is designed. And the circuit includes a built-in-self-test block using the 13N March algorithm. The circuit has been implemented using the $0.25{\mu}m$ MagnaChip CMOS process and has $1.1\times0.7mm^2$ chip area with 10,658 transistors.

본 논문에서는 내장메모리의 고장을 효율적으로 치유하기 위해 2차원의 여분 메모리를 이용한 내장메모리의 자가치유회로를 제안한다. 내장메모리에 같은 행(열)에 다수의 고장이 발생할 경우에 기존의 1차원의 여분 열(행) 메모리를 이용할 경우에는 고장 수만큼의 여분 메모리 열(행)이 필요하나. 2차원의 메모리를 사용하는 본 방법에서는 하나의 여분 메모리 행(열)으로 치유가 가능하다. 또한, 가상분할 메모리방식을 이용함으로써 여분 메모리 열 전체가 아니라 부분 열을 이용하여 치유가 가능하다. 본 구조를 이용하여, $64\times1$ bit의 코어메모리와 $2\times8$의 2차원 여분 메모리로 구성된 자가치유회로를 설계한다. 그리고, 고장검출을 위해서 13N March 알고리즘을 가진 자가테스트회로를 내장한다. 매그너칩 $0.25{\mu}m$ CMOS공정을 이용하여 Full-Custom으로 설계한 결과, 10,658개의 Tr.수에 코어면적은 $1.1\times0.7mm^2$이 소요되었다.

Keywords

References

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